Sub-Wavelength Near-Field Metal Detection using an On-Chip Spintronic Technique
WANG Qi1,2, ZHU Xiao-Feng2, YUAN Xiao-Wen1, CHEN Chang-Qing1, LUO Xiang-Dong2**, ZHANG Bo2**
1Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan 430074 2National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083
Abstract:A spintronic near-field microwave imaging system without vector network analyzers is used to detect the distribution of microwaves, which are scattered by a sub-wavelength periodical metal wire grating. An ultra thin metal body with diameter of 100 μm (λ/300) is observed by imaging illuminated by a 10 GHz shining source. An application with high sensitivity and resolution detection is proposed in the microwave region under a weak applied external static magnetic field.