Stable Organic Field Effect Transistors with Low-Cost MoO3/Al Source-Drain Electrodes
ZHANG Hui1,2, MI Bao-Xiu1,2, LI Xin1,2, GAO Zhi-Qiang1**, ZHAO Lu1,2, HUANG Wei2
1Jiangsu Engineering Centre for Flat-Panel Displays and Solid-state Lighting and College of Materials Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing 210046 2Key Laboratory for Organic Electronics and Information Displays and Institute of Advanced Materials, Nanjing University of Posts and Telecommunications, Nanjing 210046
Abstract：Stable organic field effect transistors (OFETs) based on copper phthalocyanine (CuPc) are reported using MoO3/Al as source-drain top contacts. By annealing the fabricated device at 130°C in air, the mobility and the stability of the OFETs can be significantly improved in comparison with the untreated device. The heat-treated devices without encapsulation show a device storage stability of nearly 400 h while the untreated one only 183 h. This improvement is suggested to be mainly attributed to the reduction of the contact barrier between CuPc and the electrode, as well as the better alignment of CuPc molecules via post annealing.
2013, Vol. 30 
