Frequency Stabilization Using Polarization Spectroscopy and Cr-He Hollow Cathode Discharge
YIN Cong1**, QIAN Jin1, ZHANG Xiao-Ping1, SHI Chun-Ying1, WANG Han-Ping1, HUANG Sheng-Ye2
1Division of Metrology in Length and Precision Engineering, National Institute of Metrology, Beijing 100013 2China South Industry Academe, Beijing 100089
Frequency Stabilization Using Polarization Spectroscopy and Cr-He Hollow Cathode Discharge
YIN Cong1**, QIAN Jin1, ZHANG Xiao-Ping1, SHI Chun-Ying1, WANG Han-Ping1, HUANG Sheng-Ye2
1Division of Metrology in Length and Precision Engineering, National Institute of Metrology, Beijing 100013 2China South Industry Academe, Beijing 100089
摘要Polarization spectroscopy is used to lock a frequency-doubled Ti:Sapphire laser to the 425.5 nm 7S3→7P40 transition of 52Cr. A Cr−He hollow cathode discharge cell is designed and fabricated to produce Cr atom vapor instead of a high temperature cell. Without any modulation devices or lock-in amplifiers, a high signal-to-background level polarization spectroscopy signal is obtained. Moreover, a frequency fluctuation of ±295 kHz for more than one hour is achieved.
Abstract：Polarization spectroscopy is used to lock a frequency-doubled Ti:Sapphire laser to the 425.5 nm 7S3→7P40 transition of 52Cr. A Cr−He hollow cathode discharge cell is designed and fabricated to produce Cr atom vapor instead of a high temperature cell. Without any modulation devices or lock-in amplifiers, a high signal-to-background level polarization spectroscopy signal is obtained. Moreover, a frequency fluctuation of ±295 kHz for more than one hour is achieved.
[1] McClelland J J, Anderson W R, Bradley C C et al 2003 J. Res. Natl. Inst. Stan. 108 99
[2] Demtröder W 2008 Laser Spectroscopy vol 2 Experimental Techniques 4th edn (Berlin: Springer) chap 2 p 104
[3] Wieman C and Hänsch T W 1976 Phys. Rev. Lett. 36 1170
[4] Moon H S, Jeong D Y, Ko K H and Jung E C 2003 Opt. Commun. 228 133
[5] Ma J, Zhao Y T, Zhao J M and Jia S T 2005 Chin. J. Lasers 32 1605 (in Chinese)
[6] Pearman C P, Adams C S, Cox S G, Griffin P F, Smith D A and Hughes I G 2002 J. Phys. B: At. Mol. Opt. Phys. 35 5141
[7] Yoshikawa Y, Umeki T, Mukae T, Torii Y and Kuga T 2003 Appl. Opt. 42 6645
[8] Drodofsky U 1997 PhD Dissertation (Germany: Universität Konstanz)
[9] Jürgens D 2004 PhD Dissertation (Germany: Universität Konstanz)
[10] Smeets B, Bosch R C M, Van Der Straten P, Te Sligte E, Scholten R E, Beijerinck H C W and Van Leeuwen K A H 2003 Appl. Phys. B 76 815
[11] Bosch R C M 2002 PhD Dissertation (Netherlands: Technische Universiteit Eindhoven)
2011, Vol. 28 
