Imaging of the Al Structure of an Ultrathin Alumina Film Grown on Cu-9 at.%Al(111) by STM
ZHANG Yun1,2, YU Ying-Hui1**, SHE Li-Min1,2, QIN Zhi-Hui1, CAO Geng-Yu1
1State Key Laboratory of Magnetic Resonance and Atomic and Molecular Physics, Wuhan Institute of Physics and Mathematics, Chinese Academy of Sciences, Wuhan 430071 2Graduate School of the Chinese Academy of Sciences, Beijing 100049
Imaging of the Al Structure of an Ultrathin Alumina Film Grown on Cu-9 at.%Al(111) by STM
ZHANG Yun1,2, YU Ying-Hui1**, SHE Li-Min1,2, QIN Zhi-Hui1, CAO Geng-Yu1
1State Key Laboratory of Magnetic Resonance and Atomic and Molecular Physics, Wuhan Institute of Physics and Mathematics, Chinese Academy of Sciences, Wuhan 430071 2Graduate School of the Chinese Academy of Sciences, Beijing 100049
摘要An ultrathin alumina film grown on a Cu-9 at.%Al(111) substrate is investigated using low-temperature scanning tunneling microscopy and spectroscopy. The topographic images show a zigzagged corrugation characterized by the heptagonal and pentagonal organization of interfacial aluminum atoms and by a dependence on the bias voltage. Furthermore, the dI/dV maps and the spectrum reveal an unoccupied state locating at about +0.26 eV, which most likely originates from the aluminum-oxygen hybridization and is possibly responsible for the heptagonal and pentagonal arrangements of Al atoms.
Abstract：An ultrathin alumina film grown on a Cu-9 at.%Al(111) substrate is investigated using low-temperature scanning tunneling microscopy and spectroscopy. The topographic images show a zigzagged corrugation characterized by the heptagonal and pentagonal organization of interfacial aluminum atoms and by a dependence on the bias voltage. Furthermore, the dI/dV maps and the spectrum reveal an unoccupied state locating at about +0.26 eV, which most likely originates from the aluminum-oxygen hybridization and is possibly responsible for the heptagonal and pentagonal arrangements of Al atoms.
(Scanning tunneling microscopy (including chemistry induced with STM))
引用本文:
ZHANG Yun;YU Ying-Hui**;SHE Li-Min;QIN Zhi-Hui;CAO Geng-Yu
. Imaging of the Al Structure of an Ultrathin Alumina Film Grown on Cu-9 at.%Al(111) by STM[J]. 中国物理快报, 2011, 28(6): 66802-066802.
ZHANG Yun, YU Ying-Hui**, SHE Li-Min, QIN Zhi-Hui, CAO Geng-Yu
. Imaging of the Al Structure of an Ultrathin Alumina Film Grown on Cu-9 at.%Al(111) by STM. Chin. Phys. Lett., 2011, 28(6): 66802-066802.
[1] Franchy R 2000 Surf. Sci. Rep. 38 195
[2] Lopez N and Valeri S 2004 Phys. Rev. B 70 125428
[3] Kulawik M, Nilius N, Rust H P and Freund H J 2003 Phys. Rev. Lett. 91 256101
[4] Kresse G, Schmid M, Napetschnig E, Shishkin M, Köhler L and Varga P 2005 Science 308 1440
[5] Prévot G, Naitabdi A, Bernard R and Borensztein Y 2010 Phys. Rev. B 81 085405
[6] Jiang P, Wang L L, Ning Y X, Qi Y, Ma X C, Jia J F and Xue Q K 2009 Chin. Phys. Lett. 26 016803
[7] Schmid M, Shishkin M, Kresse G, Napetschnig E and Varga P 2006 Phys. Rev. Lett. 97 046101
[8] Schintke S, Messerli S, Pivetta M, Patthey F, Libioulle L, Stengel M, Vita A D and Schneider W-D 2001 Phys. Rev. Lett. 87 276801
[9] Nilius N, Kulawik M, Rust H P and Freund H J 2004 Phys. Rev. B 69 121401(R)
[10] Maroutian T, Degen S, Becker C, Wandelt K and Berndt R 2003 Phys. Rev. B 68 155414
[11] Zhang Y, Yu Y H, She L M, Qin Z H and Cao G Y 2011 Thin Solid Films (submitted)
[12] Napetschnig E, Schmid M and Varga P 2008 Surf. Sci. 602 1750
[13] Yang R, Tanaka S and Kohyama M 2004 Phil. Mag. Lett. 84 425
[14] Yoshitake M, Song W J, Libra J, Mašek K, Šutara F, Matolín V and Prince K C 2008 J. Appl. Phys. 103 033707
[15] Lundgren E, Kresse G, Klein C, Borg M, Andersen J N, Santis M De, Gauthier Y, Konvicka C, Schmid M and Varga P 2002 Phys. Rev. Lett. 88 246103
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