摘要A technique of flat crystal x-ray spectrometer for quantitative spectral measurement is described. For the flat crystal spectrograph geometry, the quantitative reduction of relating the CCD counts back to the photon flux from the x-ray source is established. The absolute calibrations of the integral diffraction coefficients of the crystal and the CCD sensitivity make it possible to measure absolute photons flux within the energy range of 2000–5000 eV. The uncertainty analysis of the calibrations is carried out to obtain the energy resolved uncertainties of crystal and CCD. Thus, the experimental spectra with spectral resolved intensity uncertainties are available. Then, a performing experiment of laser-produced Ti plasma is carried out and the absolute x-ray spectra with intensity uncertainty less than 8.5% are obtained. The technique is promising for absolute spectral measurement of high temperature plasmas in a kilo-electron-volt region.
Abstract：A technique of flat crystal x-ray spectrometer for quantitative spectral measurement is described. For the flat crystal spectrograph geometry, the quantitative reduction of relating the CCD counts back to the photon flux from the x-ray source is established. The absolute calibrations of the integral diffraction coefficients of the crystal and the CCD sensitivity make it possible to measure absolute photons flux within the energy range of 2000–5000 eV. The uncertainty analysis of the calibrations is carried out to obtain the energy resolved uncertainties of crystal and CCD. Thus, the experimental spectra with spectral resolved intensity uncertainties are available. Then, a performing experiment of laser-produced Ti plasma is carried out and the absolute x-ray spectra with intensity uncertainty less than 8.5% are obtained. The technique is promising for absolute spectral measurement of high temperature plasmas in a kilo-electron-volt region.
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2011, Vol. 28 
