Potential and Kinetic Electron Emissions from HOPG Surface Irradiated by Highly Charged Xenon and Neon Ions
WANG Yu-Yu1,2**, ZHAO Yong-Tao1, SUN Jian-Rong1, LI De-Hui1, QAYYUM Abdul 3 , LI Jin-Yu1, WANG Ping-Zhi1, XIAO Guo-Qing1
1Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000 2Graduate University of the Chinese Academy of Sciences, Beijing 100049 3Physics Division, Pakistan Institute of Nuclear Science and Technology, P.O. Nilore, Islamabad, Pakistan
Potential and Kinetic Electron Emissions from HOPG Surface Irradiated by Highly Charged Xenon and Neon Ions
WANG Yu-Yu1,2**, ZHAO Yong-Tao1, SUN Jian-Rong1, LI De-Hui1, QAYYUM Abdul 3 , LI Jin-Yu1, WANG Ping-Zhi1, XIAO Guo-Qing1
1Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000 2Graduate University of the Chinese Academy of Sciences, Beijing 100049 3Physics Division, Pakistan Institute of Nuclear Science and Technology, P.O. Nilore, Islamabad, Pakistan
摘要Highly charged 129Xeq+ (q=10–30) and 40Neq+ (q=4–8) ion−induced secondary electron emissions on the surface of highly oriented pyrolytic graphite (HOPG) are reported. The total secondary electron yield is measured as a function of the potential energy of incident ions. The experimental data are used to separate contributions of kinetic and potential electron yields. Our results show that about 4.5% and 13.2% of ion's potential energies are consumed in potential electron emission due to different Xeq+−HOPG and Neq+-HOPG combinations. A simple formula is introduced to estimate the fraction of ion's potential energy for potential electron emission.
Abstract：Highly charged 129Xeq+ (q=10–30) and 40Neq+ (q=4–8) ion−induced secondary electron emissions on the surface of highly oriented pyrolytic graphite (HOPG) are reported. The total secondary electron yield is measured as a function of the potential energy of incident ions. The experimental data are used to separate contributions of kinetic and potential electron yields. Our results show that about 4.5% and 13.2% of ion's potential energies are consumed in potential electron emission due to different Xeq+−HOPG and Neq+-HOPG combinations. A simple formula is introduced to estimate the fraction of ion's potential energy for potential electron emission.
(Atomic, molecular, and ion beam impact and interactions with surfaces)
引用本文:
WANG Yu-Yu;**;ZHAO Yong-Tao;SUN Jian-Rong;LI De-Hui;QAYYUM Abdul ;LI Jin-Yu;WANG Ping-Zhi;XIAO Guo-Qing
. Potential and Kinetic Electron Emissions from HOPG Surface Irradiated by Highly Charged Xenon and Neon Ions[J]. 中国物理快报, 2011, 28(5): 53402-053402.
WANG Yu-Yu, **, ZHAO Yong-Tao, SUN Jian-Rong, LI De-Hui, QAYYUM Abdul , LI Jin-Yu, WANG Ping-Zhi, XIAO Guo-Qing
. Potential and Kinetic Electron Emissions from HOPG Surface Irradiated by Highly Charged Xenon and Neon Ions. Chin. Phys. Lett., 2011, 28(5): 53402-053402.
[1] Hasselkamp D 1992 Particle Induced Electron Emission II (Berlin: Springer) vol 123 pp 1–95
[2] Aumayr F and Winter HP 2007 Slow Heavy-Particle Induced Electron Emission (Berlin: Springer) chap 3 p 79–112
[3] Hughees I G, Burgdoerfer J, Folkerts L, Havener C C, Overbury S H, Robinson M T, Zehner D M, Zeijlmans van Emmichoven P A and Meyer F W 1993 Phys. Rev. Lett. 71 291
[4] Lemell C, Stockl J, Burgdoerfer J, Betz G, Winter HP and Aumayr F 1998 Phys. Rev. Lett. 81 1965
[5] Stockl J, Suta T, Ditroi F, Winter HP and Aumayr F 2004 Phys. Rev. Lett. 93 263201
[6] Delaunay M, Fehrringer M, Geller R, Hitz D, Varga P and Winter H 1987 Phys. Rev. B 35 4232
[7] Wang Y, Zhao Y, Qayyum A and Xiao G 2007 Nucl. Instrum. Methods B 265 474
[8] Zhao Y, Xiao G, Xu Z, Qayyum A, Wang Y, Zhang X, Li F and Zhan W 2007 Acta Phys. Sin. 56 10 (in Chinese)
2011, Vol. 28 
