摘要A sum of two or more exponential decay functions is empirically adopted nowadays to analyze the decay curve of long-persistent phosphor. However, the fitting parameters of this empirical model lack well-defined physical meanings, especially when the number of exponential decay function is greater than two. We propose a phenomenological model to describe the decay curve of long-persistent phosphor based on an analysis of the relationship between carrier concentration and light-emitting intensity. This model has a few fitting parameters with well-defined physical meanings as compared to the current empirical one. With this model, we quantitatively analyze the decay processes of typical long-persistent phosphors of SrAl2O4:Eu,Dy and obtain reasonable fitting results.
Abstract：A sum of two or more exponential decay functions is empirically adopted nowadays to analyze the decay curve of long-persistent phosphor. However, the fitting parameters of this empirical model lack well-defined physical meanings, especially when the number of exponential decay function is greater than two. We propose a phenomenological model to describe the decay curve of long-persistent phosphor based on an analysis of the relationship between carrier concentration and light-emitting intensity. This model has a few fitting parameters with well-defined physical meanings as compared to the current empirical one. With this model, we quantitatively analyze the decay processes of typical long-persistent phosphors of SrAl2O4:Eu,Dy and obtain reasonable fitting results.
(Fluorescence and phosphorescence; radiationless transitions, quenching (intersystem crossing, internal conversion))
引用本文:
CHEN Bin;HAO Hong-Chen;ZHU Jiang;LU Ming**
. A Phenomenological Model for Decay Process of Long-Persistent Phosphorescence[J]. 中国物理快报, 2011, 28(5): 53201-053201.
CHEN Bin, HAO Hong-Chen, ZHU Jiang, LU Ming**
. A Phenomenological Model for Decay Process of Long-Persistent Phosphorescence. Chin. Phys. Lett., 2011, 28(5): 53201-053201.
[1] Matsuzawa T, Aoki Y, Takeuchi N and Murayama Y 1996 J. Electrochem. Soc. 143 2670
[2] Sakai R, Katsumata T and Momuro T 1999 J. Lumin. 85 149
[3] Aizawa H, Komuro S, Katsumata T, Sato S and Morikawa T 2006 Thin Solid Films 496 179
[4] Dorenbos P 2007 J. Lumin. 122–123 315
[5] Chen R, Wang Y, Hu Y, Hu Z and Liu C 2008 J. Lumin. 128 1180
[6] Lin L, Shi C, Wang Z, Zhang W and Yin M 2008 J. Alloys Compd. 466 546
[7] Chang C, Li W, Huang X, Wang Z, Chen X, Qian X, Guo R, Ding Y and Mao D 2010 J. Lumin. 130 347
[8] Hao H, Chen B, Zhu J and Lu M 2011 Chin. J. Lumin. 32 60 (in Chinese)
2011, Vol. 28 
