Cs+-K+ Exchange in Z-Cut KTiOPO4 Crystal Covered with Chromium Masking Layer
ZHANG Rui-Feng1, LU Fei1, LIAN Jie1, LIU Han-Ping1, LIU Xiang-Zhi1, WANG Liang-Ling2, WANG Ke-Ming2, LU Qing-Ming3
1School of Information Science and Engineering, Shandong University, Jinan 2501002School of Physics and Microelectronics, Shandong University, Jinan 2501003School of Chemistry and Chemical Engineering, Shandong University, Jinan 250100
Cs+-K+ Exchange in Z-Cut KTiOPO4 Crystal Covered with Chromium Masking Layer
1School of Information Science and Engineering, Shandong University, Jinan 2501002School of Physics and Microelectronics, Shandong University, Jinan 2501003School of Chemistry and Chemical Engineering, Shandong University, Jinan 250100
摘要Cs+--K+ ion exchanges are performed on z-cut KTiOPO4 crystals with chromium coating covered. The temperature of ion exchange is 430°C, and the time range from 15min to 30min. The dark mode spectra of the samples are measured by the prism coupling method. The channel structures on the samples are observed by a microscope and the near field pattern of the channel waveguides are measured by the end-fire coupling method. The refractive index of the samples increases and the increments at surface are modulated due to the existence of Cr film. In the region covered by Cr film, the refractive index of the samples at the surface increases dramatically in a shallow layer. The results of energy dispersive x-ray spectra indicate that in the region covered with Cr film, Cr ions participate in the ion exchange process, and enhance the refractive index. The results may provide a possibility that achieves index enhancement and Cr doping synchronically.
Abstract：Cs+--K+ ion exchanges are performed on z-cut KTiOPO4 crystals with chromium coating covered. The temperature of ion exchange is 430°C, and the time range from 15min to 30min. The dark mode spectra of the samples are measured by the prism coupling method. The channel structures on the samples are observed by a microscope and the near field pattern of the channel waveguides are measured by the end-fire coupling method. The refractive index of the samples increases and the increments at surface are modulated due to the existence of Cr film. In the region covered by Cr film, the refractive index of the samples at the surface increases dramatically in a shallow layer. The results of energy dispersive x-ray spectra indicate that in the region covered with Cr film, Cr ions participate in the ion exchange process, and enhance the refractive index. The results may provide a possibility that achieves index enhancement and Cr doping synchronically.
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2008, Vol. 25 
