Room-Temperature Growth of Al Films on Si(111)-7×7 Surface
LIU Hong, ZHANG Yan-Feng, WANG De-Yong, JIA Jin-Feng, XUE Qi-Kun
State Key Laboratory for Surface Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100080
Room-Temperature Growth of Al Films on Si(111)-7×7 Surface
LIU Hong;ZHANG Yan-Feng;WANG De-Yong;JIA Jin-Feng;XUE Qi-Kun
State Key Laboratory for Surface Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100080
关键词 ：
68.35.-p ,
68.36.Md ,
68.37.Ef ,
61.14.Hg
Abstract ： Reflection high energy electron diffraction and scanning tunnelling microscopy (STM) are used to investigate the structure and morphology of Al films deposited on Si(111)-7×7 surface at room temperature. The films are polycrystalline, made up of (100) and (111) oriented islands, which primarily result from the interface elastic effect and free surface energies of the Al (100) and (111) surfaces.
Key words ：
68.35.-p
68.36.Md
68.37.Ef
61.14.Hg
出版日期: 2004-08-01
:
68.35.-p
(Solid surfaces and solid-solid interfaces: structure and energetics)
68.36.Md
68.37.Ef
(Scanning tunneling microscopy (including chemistry induced with STM))
61.14.Hg
引用本文:
LIU Hong;ZHANG Yan-Feng;WANG De-Yong;JIA Jin-Feng;XUE Qi-Kun. Room-Temperature Growth of Al Films on Si(111)-7×7 Surface[J]. 中国物理快报, 2004, 21(8): 1608-1611.
链接本文:
https://cpl.iphy.ac.cn/CN/
或
https://cpl.iphy.ac.cn/CN/Y2004/V21/I8/1608
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2004, Vol. 21 
