InP film samples were prepared by spray pyrolysis technique using aqueous solutions of InCl3 and Na2HPO4, which were atomized with compressed air as carrier gas onto glass substrates at 500°C with different thicknesses of the films. It is found that the resistivity of the polycrystalline films strongly depends on the grain size. It is observed that the grain size of the films increase with the decrease of the energy band gap and strain of the film. The changes observed in the energy band gap and strain related to the film grain size of the films are discussed in detail.
InP film samples were prepared by spray pyrolysis technique using aqueous solutions of InCl3 and Na2HPO4, which were atomized with compressed air as carrier gas onto glass substrates at 500°C with different thicknesses of the films. It is found that the resistivity of the polycrystalline films strongly depends on the grain size. It is observed that the grain size of the films increase with the decrease of the energy band gap and strain of the film. The changes observed in the energy band gap and strain related to the film grain size of the films are discussed in detail.
Mustafa Öztas. Influence of Grain Size on Electrical and Optical Properties of InP Films[J]. 中国物理快报, 2008, 25(11): 4090-4092.
Mustafa Ö, ztas. Influence of Grain Size on Electrical and Optical Properties of InP Films. Chin. Phys. Lett., 2008, 25(11): 4090-4092.
[1] Kazmerski L L 1980 Polycrystalline and Amorphous Thin Films and Devices (New York: Academic) [2] Lee M K, Wuu D S and Herng R H 1993 Appl. Phys. Lett. 62 1140 [3] Ito K and Nakazowa T 1988 J. Appl. Phys. 58 2638 [4] Li X, Wanless M W, Gessert T A, Emery K A and Coutts T J 1989 Appl. Phys. Lett. 54 2674 [5] Byrne E K, Parkanyi L and Thepold K H 1988 Science 241 332 [6] Guzelian A A, Katari J E B, Kadavanich A V, Banin U, Hamad K, Juban E, Alivisators A P, Wolters R H and Arnold C C 1996 J. Phys. Chem. 100 7212 [7] Bedir M, Oztas M, Bakkaloglu O F and Ormanci R B 2005 Eur. Phys. J. 45 465 [8] Aksoy F, Kayali, Oztas M and Bedir M 2008 J. Phys. Chem. Sol. 69 835 [9] Harper J M E, Cabral Jr C, Andricacos P C, Gignac L, Noyan I C, Rodbell K P and Hu C K 1999 J. Appl. Phys. 86 2518 [10] Kale S S and Lokhande C D 2000 Mater. Chem. Phys. 62 103 [11] Maissel L I and Glang R 1970 Handbook of Thin Film Technology (New York: McGraw-Hill) [12] Tiburcio-Silver A, Joubert J C and Labeau M 1991 Thin Solid Films 197 195 [13] Oztas M and Yaz{\ic{\i 2004 J. Lumin. 110 31 [14] Tian G L, He H B and Shao J D 2005 Chin. Phys. Lett. 22 1787 [15] Rakshani A E and Al-Azab A S 2000 J. Phys.: Condens. Matter. 12 8745 [16] Ghosh R, Basak D and Fujihara S 2004 J. Appl. Phys. 96 2689
2008, Vol. 25 
