摘要First-principles density functional perturbation calculations are employed to study the dielectric and piezoelectric properties of strained tetragonal PbTiO3. Lattice distortion, static dielectric constant, Born effective charge, zone-centre phonons, and piezoelectric constant are obtained. For the strained tetragonal PbTiO3, we obtain a giant static dielectric constant (3600) under a strain 0.77%. Moreover, the calculated piezoelectric constant e15 of strained PbTiO3 reaches about 203C/m2 which is about 20 times of that of unstrained system. The giant static dielectric constant is mainly due to the softening of the lowest-frequency phonon mode and the reduce of Ti-O bond length. This work demonstrates a route to a giant static dielectrics for electrically microwave and other devices.
Abstract:First-principles density functional perturbation calculations are employed to study the dielectric and piezoelectric properties of strained tetragonal PbTiO3. Lattice distortion, static dielectric constant, Born effective charge, zone-centre phonons, and piezoelectric constant are obtained. For the strained tetragonal PbTiO3, we obtain a giant static dielectric constant (3600) under a strain 0.77%. Moreover, the calculated piezoelectric constant e15 of strained PbTiO3 reaches about 203C/m2 which is about 20 times of that of unstrained system. The giant static dielectric constant is mainly due to the softening of the lowest-frequency phonon mode and the reduce of Ti-O bond length. This work demonstrates a route to a giant static dielectrics for electrically microwave and other devices.
[1] Eisenbeiser K, Finder J M, Yu Z, Ramdani J, Curless J A,Hallmark J A, Droopad R, Ooms W J, Salem L, Bradshaw S and OvergaardC D 2000 Appl. Phys. Lett. 76 1324 [2] Kim W J, Chang W, Qadri S B, Pond J M, Kirchoefer S W,Chrisey D B and Horwitz J S 2000 Appl. Phys. Lett. 761185 [3] Choi K J, Biegalski M, Li Y L, Sharan A, Schubert J,Uecker R, Reiche P, Chen Y B, Pan X Q, Gopalan V, Chen L Q, Schlom DG and Eom C B 2004 Science 306 1005 [4] Park B H, Peterson E J, Jia Q X, Lee J, Zeng X, Si W andXi X X 2001 Appl. Phys. Lett. 78 533 [5] Kim L, Kim J, Jung D and Lee J 2005 Thin Solid Films 475 97 [6] Kim L, Jung D, Kim J, Kim Y S and Lee J 2003 Appl.Phys. Lett. 82 2118 [7] Bungaro C and Rabe K M 2004 Phys. Rev. B 69184101 [8] Antons A, Neaton J B, Rabe K M and Vanderbilt D 2005 Phys. Rev. B 71 024102 [9] Gonze et al 2002 Comput. Mater. Sci. 25 478 [10] Gonze X 1997 Phys. Rev. B 55 10337 [11] Gonze X and Lee C 1997 Phys. Rev. B 55 10355