Dependence of Interlayer AF Coupling on Ferromagnetic Layer Thickness in [Pt/Co]5/Ru/[Co/Pt]5 Multilayers
ZHAO Jing, WANG Yin-Jun, HAN Xiu-Feng
State Key Laboratory of Magnetism, Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, PO Box 603, Beijing 100190
Dependence of Interlayer AF Coupling on Ferromagnetic Layer Thickness in [Pt/Co]5/Ru/[Co/Pt]5 Multilayers
ZHAO Jing, WANG Yin-Jun, HAN Xiu-Feng
State Key Laboratory of Magnetism, Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, PO Box 603, Beijing 100190
摘要We study magnetization reversal in the interlayer coupled [Pt/Co]5/Ru/[Co/Pt]5 multilayers (MLs) by means of the measurement of extraordinary Hall effect (EHE). Fitting experimental data to a simple model, we determine the interlayer coupling strength for various thicknesses of the ferromagnetic layers at a fixed Ru spacer thickness. It is found that the dependence of interlayer coupling strength on the Pt layer thickness is much stronger than the previous report in the ferromagnetic/nonmagnetic/ferromagnetic multilayers.
Abstract：We study magnetization reversal in the interlayer coupled [Pt/Co]5/Ru/[Co/Pt]5 multilayers (MLs) by means of the measurement of extraordinary Hall effect (EHE). Fitting experimental data to a simple model, we determine the interlayer coupling strength for various thicknesses of the ferromagnetic layers at a fixed Ru spacer thickness. It is found that the dependence of interlayer coupling strength on the Pt layer thickness is much stronger than the previous report in the ferromagnetic/nonmagnetic/ferromagnetic multilayers.
ZHAO Jing;WANG Yin-Jun;HAN Xiu-Feng. Dependence of Interlayer AF Coupling on Ferromagnetic Layer Thickness in [Pt/Co]5/Ru/[Co/Pt]5 Multilayers[J]. 中国物理快报, 2009, 26(3): 37302-037302.
ZHAO Jing, WANG Yin-Jun, HAN Xiu-Feng. Dependence of Interlayer AF Coupling on Ferromagnetic Layer Thickness in [Pt/Co]5/Ru/[Co/Pt]5 Multilayers. Chin. Phys. Lett., 2009, 26(3): 37302-037302.
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