中国物理快报  2009, Vol. 26 Issue (5): 53101-053101    DOI: 10.1088/0256-307X/26/5/053101
  ATOMIC AND MOLECULAR PHYSICS 本期目录 | 过刊浏览 | 高级检索 |
Atomic Layer Deposition of Al2O3 on H-Passivated GeSi: Initial Surface Reaction Pathways with H/GeSi(100)-2×1
SHI Yu, SUN Qing-Qing, DONG Lin, LIU Han, DING Shi-Jin, ZHANG Wei
State Key Laboratory of ASIC and System, Department of Microelectronics, Fudan University, Shanghai 200433
Atomic Layer Deposition of Al2O3 on H-Passivated GeSi: Initial Surface Reaction Pathways with H/GeSi(100)-2×1
SHI Yu, SUN Qing-Qing, DONG Lin, LIU Han, DING Shi-Jin, ZHANG Wei
State Key Laboratory of ASIC and System, Department of Microelectronics, Fudan University, Shanghai 200433