In/Pd-Doped SnO2-Based CO Micro-Structure Sensor with High Sensitivity and Quick Response
LIU Li1,2, ZHANG Tong1, LI Shou-Chun2, WANG Lian-Yuan2, FAN Hui-Tao1, LI Wei2
1State Key Laboratory on Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 1300122College of Physics, Jilin University, Changchun 130012
In/Pd-Doped SnO2-Based CO Micro-Structure Sensor with High Sensitivity and Quick Response
LIU Li1,2, ZHANG Tong1, LI Shou-Chun2, WANG Lian-Yuan2, FAN Hui-Tao1, LI Wei2
1State Key Laboratory on Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 1300122College of Physics, Jilin University, Changchun 130012
摘要In/Pd-doped SnO2 is synthesized via a sol-gel method and coated on a silicon substrate with Pt electrodes to fabricate a micro-structure sensor. The sensor can be used to detect CO down to 1ppm (the sensitivity is about 3), and the response time and recovery time are about 5 and 15s, respectively. Excellent selectivity is also found based on our sensor. These results demonstrate a promising approach to fabricate high-performance CO sensors with high sensitivity and quick response.
Abstract:In/Pd-doped SnO2 is synthesized via a sol-gel method and coated on a silicon substrate with Pt electrodes to fabricate a micro-structure sensor. The sensor can be used to detect CO down to 1ppm (the sensitivity is about 3), and the response time and recovery time are about 5 and 15s, respectively. Excellent selectivity is also found based on our sensor. These results demonstrate a promising approach to fabricate high-performance CO sensors with high sensitivity and quick response.
LIU Li;ZHANG Tong;LI Shou-Chun;WANG Lian-Yuan;FAN Hui-Tao;LI Wei. In/Pd-Doped SnO2-Based CO Micro-Structure Sensor with High Sensitivity and Quick Response[J]. 中国物理快报, 2009, 26(10): 100702-100702.
LIU Li, ZHANG Tong, LI Shou-Chun, WANG Lian-Yuan, FAN Hui-Tao, LI Wei. In/Pd-Doped SnO2-Based CO Micro-Structure Sensor with High Sensitivity and Quick Response. Chin. Phys. Lett., 2009, 26(10): 100702-100702.
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