中国物理快报  2009, Vol. 26 Issue (11): 114210-114210    DOI: 10.1088/0256-307X/26/11/114210
  FUNDAMENTAL AREAS OF PHENOMENOLOGY(INCLUDING APPLICATIONS) 本期目录 | 过刊浏览 | 高级检索 |
Measurement of Refractive Index for High Reflectance Materials with Terahertz Time Domain Reflection Spectroscopy
SUN Wen-Feng1, WANG Xin-Ke2, ZHANG Yan1
1Beijing Key Lab for Terahertz Spectroscopy and Imaging, Key Laboratory of Terahertz Optoelectronics (Ministry of Education), Department of Physics, Capital Normal University, Beijing 1000482Department of Physics, Harbin Institute of Technology, Harbin 150001
Measurement of Refractive Index for High Reflectance Materials with Terahertz Time Domain Reflection Spectroscopy
SUN Wen-Feng1, WANG Xin-Ke2, ZHANG Yan1
1Beijing Key Lab for Terahertz Spectroscopy and Imaging, Key Laboratory of Terahertz Optoelectronics (Ministry of Education), Department of Physics, Capital Normal University, Beijing 1000482Department of Physics, Harbin Institute of Technology, Harbin 150001