中国物理快报  2006, Vol. 23 Issue (11): 3058-3060    
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Modelling of Gettering by Mechanical Damage of Metallic Impurities in Silicon
F. Ayad, M. Remram
Department of Electronics, University of Mentouri Route of Ain El-Bay Constantine, 25000 Algeria
Modelling of Gettering by Mechanical Damage of Metallic Impurities in Silicon
F. Ayad;M. Remram
Department of Electronics, University of Mentouri Route of Ain El-Bay Constantine, 25000 Algeria