Abstract： The model of fractional-dimensional space is used to study dielectric function associated with electron interband transitions near a Van Hove critical point in anisotropic systems. Using fractional derivative spectra (FDS) method, it is found that in fractional-dimensional space only a minimum yields a symmetric Lorentzian line shape in FDS but a maximum does not.
YU Zhaoxian;MO Dang. Property of Van Hove Critical Points in Fractional-Dimensional Space[J]. 中国物理快报, 1993, 10(7): 385-388.
YU Zhaoxian, MO Dang. Property of Van Hove Critical Points in Fractional-Dimensional Space. Chin. Phys. Lett., 1993, 10(7): 385-388.
1993, Vol. 10 
