中国物理快报  1991, Vol. 8 Issue (8): 400-403    
  Original Articles 本期目录 | 过刊浏览 | 高级检索 |
Combined Use of Differential Scanning Calorimetry and Cross-Sectional Transmission Electron Microscopy for Characterization of Thin-Film Reactions
MA En
Massachusetts Institute of Technology, Cambridge MA 02139, and IBM T. J. Watson Reseach Center, Yorktown Heights, NY 10598, USA
Combined Use of Differential Scanning Calorimetry and Cross-Sectional Transmission Electron Microscopy for Characterization of Thin-Film Reactions
MA En
Massachusetts Institute of Technology, Cambridge MA 02139, and IBM T. J. Watson Reseach Center, Yorktown Heights, NY 10598, USA