Energy Resolution Effects on Plasma Electron Temperature Measurements by Soft X-Ray Pulse-Height-Analysis
SHI Yue-Jiang, WAN Bao-Nian
Institute of Plasma Physics, Chinese Academy of Sciences, Hefei 230031
Energy Resolution Effects on Plasma Electron Temperature Measurements by Soft X-Ray Pulse-Height-Analysis
SHI Yue-Jiang; WAN Bao-Nian
Institute of Plasma Physics, Chinese Academy of Sciences, Hefei 230031
关键词 :
52.70.La ,
02.60.Cb
Abstract : The soft x-ray pulse-height-analysis technique is a conventional tool to measure electron temperature on tokamak. The soft x-ray spectra distortion due to energy resolution of detector will affect the temperature and impurity concentration determination. To evaluate these effects, distorted spectra as functions of energy resolution are derived by numerical modeling. The results show that the low energy resolution detector can fit for the large-sized tokamak soft x-ray spectra.
Key words :
52.70.La
02.60.Cb
出版日期: 2001-04-01
:
52.70.La
(X-ray and γ-ray measurements)
02.60.Cb
(Numerical simulation; solution of equations)
引用本文:
SHI Yue-Jiang; WAN Bao-Nian. Energy Resolution Effects on Plasma Electron Temperature Measurements by Soft X-Ray Pulse-Height-Analysis[J]. 中国物理快报, 2001, 18(4): 562-563.
SHI Yue-Jiang, WAN Bao-Nian. Energy Resolution Effects on Plasma Electron Temperature Measurements by Soft X-Ray Pulse-Height-Analysis. Chin. Phys. Lett., 2001, 18(4): 562-563.
链接本文:
https://cpl.iphy.ac.cn/CN/
或
https://cpl.iphy.ac.cn/CN/Y2001/V18/I4/562
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