Monolayer Oscillation Observed by an Oblique-Incidence Reflectance Difference Technique for the Epitaxial Growth of Oxides
CHEN Fan1 , LÜ Hui-Bin1 , ZHAO Tong1 , CHEN Zheng-Hao1 , YANG Guo-Zhen1 , ZHU Xiang-Dong2
1 Laboratory of Optical Physics, Institute of Physics and Center for Condense Matter Physics, Chinese Academy of Sciences, Beijing 100080
2 Department of Physics, University of California, Davis, California 95616-8677, USA
Monolayer Oscillation Observed by an Oblique-Incidence Reflectance Difference Technique for the Epitaxial Growth of Oxides
CHEN Fan1 ;LÜ Hui-Bin1 ;ZHAO Tong1 ;CHEN Zheng-Hao1 ;YANG Guo-Zhen1 ;ZHU Xiang-Dong2
1 Laboratory of Optical Physics, Institute of Physics and Center for Condense Matter Physics, Chinese Academy of Sciences, Beijing 100080
2 Department of Physics, University of California, Davis, California 95616-8677, USA
关键词 ：
68.55.-a ,
78.20.Ci ,
81.15.Fg
Abstract ： We report the optical oscillations with monolayer periodicity observed by an oblique-incidence reflectance difference (OIRD) technique on the epitaxial growth of Nb-doped SrTiO3 on SrTiO3 substrate. The periodicity was verified by the simultaneously measured reflection high-energy electron diffraction intensity oscillations. The OIRD oscillation damps during deposition, but can recover after the growth is interrupted for some time. We interpret the optical oscillations as a result of the periodic changes of the surface morphologies due to the two-dimensional layer-by-layer growth of thin films.
Key words ：
68.55.-a
78.20.Ci
81.15.Fg
出版日期: 2001-05-01
:
68.55.-a
(Thin film structure and morphology)
78.20.Ci
(Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity))
81.15.Fg
(Pulsed laser ablation deposition)
引用本文:
CHEN Fan;LÜHui-Bin;ZHAO Tong;CHEN Zheng-Hao;YANG Guo-Zhen;ZHU Xiang-Dong. Monolayer Oscillation Observed by an Oblique-Incidence Reflectance Difference Technique for the Epitaxial Growth of Oxides
[J]. 中国物理快报, 2001, 18(5): 665-667.
链接本文:
https://cpl.iphy.ac.cn/CN/
或
https://cpl.iphy.ac.cn/CN/Y2001/V18/I5/665
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