Femtosecond Degenerate Four-Wave-Mixing in ZnO Microcrystallite Thin Films
ZHANG Wei-li1, WANG Qing-yue1, CHAI LU2, XING Qi-rong1, K. S . Wong3, H. Wang3, Z. K. Tang3, G. K. L. Wong3, R. Jain4
1Ultrafast Laser Laboratory, School of Precision Instruments & Optoelectronics Engineering, and Optoelectronic Information Science and Technology Laboratory, 2School of Science, Tianjin University, Tianjin 300072
3Department of Physics, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong
4Center for High Technology Materials, University of New Mexico, 1313 Goddard SE, Albuquerque, NM 87106, USA
Femtosecond Degenerate Four-Wave-Mixing in ZnO Microcrystallite Thin Films
ZHANG Wei-li1;WANG Qing-yue1;CHAI LU2;XING Qi-rong1;K. S . Wong3;H. Wang3;Z. K. Tang3;G. K. L. Wong3;R. Jain4
1Ultrafast Laser Laboratory, School of Precision Instruments & Optoelectronics Engineering, and Optoelectronic Information Science and Technology Laboratory, 2School of Science, Tianjin University, Tianjin 300072
3Department of Physics, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong
4Center for High Technology Materials, University of New Mexico, 1313 Goddard SE, Albuquerque, NM 87106, USA
Abstract： Transient third-order optical nonlinearity Χ(3) of ZnO microcrystallite thin films is measured at various temperatures by using femtosecond degenerate four-wave-mixing. Room-temperature excitonic enhancement of Χ(3) is observed. The magnitude of Χ(3)) ranges between 10-4 to 10-6 esu from 4.2K to room temperature. The measured Χ(3)response time ranging from 200 to 300fs is ultrafast for temperature down to 4.2K.
ZHANG Wei-li;WANG Qing-yue;CHAI LU;XING Qi-rong;K. S . Wong;H. Wang;Z. K. Tang;G. K. L. Wong;R. Jain. Femtosecond Degenerate Four-Wave-Mixing in ZnO Microcrystallite Thin Films[J]. 中国物理快报, 1999, 16(6): 418-419.
ZHANG Wei-li, WANG Qing-yue, CHAI LU, XING Qi-rong, K. S . Wong, H. Wang, Z. K. Tang, G. K. L. Wong, R. Jain. Femtosecond Degenerate Four-Wave-Mixing in ZnO Microcrystallite Thin Films. Chin. Phys. Lett., 1999, 16(6): 418-419.
1999, Vol. 16 
