Comparison of Secondary Ion Emissions from Carbon Nanotubes under Bombardments of MeV Si and Si2 Clusters
DING Fu-Rong, SHI Ping, HE Wei-Hong, WANG Yao, NIE Rui, SHEN Ding-Yu, MA Hong-Ji
Department of Technical Physics, Peking University, Beijing 100871
Comparison of Secondary Ion Emissions from Carbon Nanotubes under Bombardments of MeV Si and Si2 Clusters
DING Fu-Rong;SHI Ping;HE Wei-Hong;WANG Yao; NIE Rui;SHEN Ding-Yu; MA Hong-Ji
Department of Technical Physics, Peking University, Beijing 100871
关键词 ：
79.20.Rf ,
61.80.Lj ,
34.50.Dy ,
36.40.-c
Abstract ： The emission yields of H, H2 , H3 and heavy ions from carbon nanotubes under bombardments of Si and Si2 clusters in an energy range of 0.3-3 MeV per atom are measured by using the time-of-flight technique (TOF). The emission yields of the secondary ions increase with increasing energy of Si and the electronic stopping processes play an important role. The enhanced emission yields of secondary ions induced by Si2 clusters at the low energies are clearly seen and attributed to the vicinage effect of the nuclear collision processes of cluster constituents and the secondary ion emissions are still dominated by electronic stopping processes at high energies.
Key words ：
79.20.Rf
61.80.Lj
34.50.Dy
36.40.-c
出版日期: 2004-03-01
:
79.20.Rf
(Atomic, molecular, and ion beam impact and interactions with surfaces)
61.80.Lj
(Atom and molecule irradiation effects)
34.50.Dy
36.40.-c
(Atomic and molecular clusters)
引用本文:
DING Fu-Rong;SHI Ping;HE Wei-Hong;WANG Yao; NIE Rui;SHEN Ding-Yu; MA Hong-Ji. Comparison of Secondary Ion Emissions from Carbon Nanotubes under Bombardments of MeV Si and Si2 Clusters[J]. 中国物理快报, 2004, 21(3): 562-564.
2 Clusters. Chin. Phys. Lett., 2004, 21(3): 562-564.
链接本文:
https://cpl.iphy.ac.cn/CN/
或
https://cpl.iphy.ac.cn/CN/Y2004/V21/I3/562
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