Abstract： The microstructures of Na2Si2O5 from room temperature up to 1773 K are studied by high temperature Raman spectroscopy. Deconvolutions of complex Raman spectra of crystal and amorphous states (glass and melt) are described. The results show that the temperature-dependent Raman spectra clearly indicate phase transition. Relative abundance of various kinds of SiO4 tetrahedrons (each Si binding to different number of bridging oxygens) can be qualitatively and quantitatively resolved as to be varied obviously with different temperatures. It manifests that high temperature Raman spectroscopy provides a useful tool for the microstructure research under high temperature and helps to explain the properties of silicate glasses and melts.
YOU Jing-Lin;JIANG Guo-Chang;XU Kuang-Di. Temperature Dependence of the Raman Spectra of Na2Si2O5[J]. 中国物理快报, 2001, 18(3): 408-410.
YOU Jing-Lin, JIANG Guo-Chang, XU Kuang-Di. Temperature Dependence of the Raman Spectra of Na2Si2O5. Chin. Phys. Lett., 2001, 18(3): 408-410.
2001, Vol. 18 
