Experimental Study of Single- and Double-Electron Detachment for Negative Carbon Ions Incident on Helium
HUANG Yong-Yi1, WU Shi-Min1, ZHANG Xue-Mei1, LI Guang-Wu2, LU Fu-Quan1, YANG Fu-Jia1
1Applied Ion Beam Physics Laboratory, Institute of Modern Physics, Fudan University, Shanghai 200433
2Institute of Nuclear Physics and Chemistry, China Academy of Engineering Physics, Mianyang 610003
Experimental Study of Single- and Double-Electron Detachment for Negative Carbon Ions Incident on Helium
1Applied Ion Beam Physics Laboratory, Institute of Modern Physics, Fudan University, Shanghai 200433
2Institute of Nuclear Physics and Chemistry, China Academy of Engineering Physics, Mianyang 610003
Abstract： Using the growth rate method, we obtain the single-electron detachment (SED) cross-sections for 5-30 keV C-+He, and double-electron detachment (DED) cross-sections for 5-15 keV C--+He. The SED cross-sections first increase with the increasing incident ion energy, and then decrease with further increase of the energy. The DED cross-sections increase with the increasing incident energy in the 5-15 keV region.
HUANG Yong-Yi;WU Shi-Min;ZHANG Xue-Mei;LI Guang-Wu;LU Fu-Quan;YANG Fu-Jia. Experimental Study of Single- and Double-Electron Detachment for Negative Carbon Ions Incident on Helium[J]. 中国物理快报, 2004, 21(7): 1262-1264.
HUANG Yong-Yi, WU Shi-Min, ZHANG Xue-Mei, LI Guang-Wu, LU Fu-Quan, YANG Fu-Jia. Experimental Study of Single- and Double-Electron Detachment for Negative Carbon Ions Incident on Helium. Chin. Phys. Lett., 2004, 21(7): 1262-1264.
2004, Vol. 21 
