High-Density Read-Only Memory Disc with Ag11 In12 Sb51 Te26 Super-Resolution Mask Layer
ZHANG Feng, WANG Yang, XU Wen-Dong, SHI Hong-Ren,WEI Jing-Song, GAN Fu-Xi
Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800
High-Density Read-Only Memory Disc with Ag11 In12 Sb51 Te26 Super-Resolution Mask Layer
ZHANG Feng;WANG Yang;XU Wen-Dong;SHI Hong-Ren,WEI Jing-Song;GAN Fu-Xi
Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800
关键词 :
42.70.Ln ,
42.70.Nq ,
42.79.Vb
Abstract : A novel read-only memory (ROM) disc with an Ag11 In12 Sb51 Te26 super-resolution mask layer is proposed and investigated for the first time to our knowledge. The carrier-to-noise ratio of more than 40dB could be obtained from small pits (380nm), which are below the readout resolution limit (400nm), in our dynamic setup with a wavelength of 632.8nm and numerical aperture of 0.40. Dependences of carrier-to-noise ratio on readout power, readout velocity and film thickness are studied. The results show that the optimum film thickness is 20-50nm and the corresponding carrier-to-noise ratio is more than 40dB at readout power of 4mW and readout velocity of 2m/s in our experiment. The super-resolution readout mechanism for this ROM disc is also discussed.
Key words :
42.70.Ln
42.70.Nq
42.79.Vb
出版日期: 2004-10-01
:
42.70.Ln
(Holographic recording materials; optical storage media)
42.70.Nq
(Other nonlinear optical materials; photorefractive and semiconductor materials)
42.79.Vb
(Optical storage systems, optical disks)
引用本文:
ZHANG Feng;WANG Yang;XU Wen-Dong;SHI Hong-Ren;WEI Jing-Song;GAN Fu-Xi. High-Density Read-Only Memory Disc with Ag11 In12 Sb51 Te26 Super-Resolution Mask Layer[J]. 中国物理快报, 2004, 21(10): 1973-1975.
ZHANG Feng, WANG Yang, XU Wen-Dong, SHI Hong-Ren, WEI Jing-Song, GAN Fu-Xi. High-Density Read-Only Memory Disc with Ag11 In12 Sb51 Te26 Super-Resolution Mask Layer. Chin. Phys. Lett., 2004, 21(10): 1973-1975.
链接本文:
https://cpl.iphy.ac.cn/CN/
或
https://cpl.iphy.ac.cn/CN/Y2004/V21/I10/1973
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