Optical Field Measurement of Nano-Apertures with a Scanning Near-Field Optical Microscope
XU Tie-Jun, XU Ji-Ying, WANG Jia, TIAN Qian
State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instruments, Tsinghua University, Beijing 100084
Optical Field Measurement of Nano-Apertures with a Scanning Near-Field Optical Microscope
XU Tie-Jun;XU Ji-Ying;WANG Jia;TIAN Qian
State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instruments, Tsinghua University, Beijing 100084
关键词 ：
78.67.-n ,
07.79.Fc ,
68.37.Uv
Abstract ： We investigate optical near-field distributions of the unconventional C-apertures and the conventional square apertures in preliminary experiment with an aperture scanning near-field optical microscope. These nano-apertures are fabricated in Au film on a glass substrate with focused ion beam technology. The experimental results indicate the uptrend of output light intensity that a C-aperture enables the intensity maximum to increase at least 10 times more than a square aperture with same unit length. The measured near-field light spot sizes of C-aperture and square aperture with 200-nm unit length are 439nm×500nm and 245nm×216nm, respectively.
Key words ：
78.67.-n
07.79.Fc
68.37.Uv
出版日期: 2004-08-01
:
78.67.-n
(Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures)
07.79.Fc
(Near-field scanning optical microscopes)
68.37.Uv
(Near-field scanning microscopy and spectroscopy)
引用本文:
XU Tie-Jun;XU Ji-Ying;WANG Jia;TIAN Qian. Optical Field Measurement of Nano-Apertures with a Scanning Near-Field Optical Microscope[J]. 中国物理快报, 2004, 21(8): 1644-1647.
链接本文:
https://cpl.iphy.ac.cn/CN/
或
https://cpl.iphy.ac.cn/CN/Y2004/V21/I8/1644
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2004, Vol. 21 
