中国物理快报  2003, Vol. 20 Issue (4): 462-464    
  Original Articles 本期目录 | 过刊浏览 | 高级检索 |
Ellipsometric Evaluation of the sp3-Bonded Carbon Fraction in Carbon Thin Films
MO Dang1, LI Fang1, CHEN Di-Hu1, WEI Ai-Xiang2,3
1State Key Laboratory of Optoelectronic Materials and Technologies, Zhongshan University, Guangzhou 510275 2Ion Beam Laboratory, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050 3Guangzhou Naval Academy, Guangzhou 510430
Ellipsometric Evaluation of the sp3-Bonded Carbon Fraction in Carbon Thin Films
MO Dang1;LI Fang1;CHEN Di-Hu1;WEI Ai-Xiang2,3
1State Key Laboratory of Optoelectronic Materials and Technologies, Zhongshan University, Guangzhou 510275 2Ion Beam Laboratory, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050 3Guangzhou Naval Academy, Guangzhou 510430