High-Sensitivity Sensor Based on Surface Plasmon Resonance Enhanced Lateral Optical Beam Displacements
YANG Xiao-Yan1, LIU De-Ming1, XIE Wen-Chong2, LI Chun-Fang3
1 Institute of Optoelectronics Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074
2 Institute of Electronic Science and Engineering, National University of Defense Technology, Changsha 410073
3 Department of Physics, Shanghai University, Shanghai 200436
High-Sensitivity Sensor Based on Surface Plasmon Resonance Enhanced Lateral Optical Beam Displacements
YANG Xiao-Yan1;LIU De-Ming1;XIE Wen-Chong2;LI Chun-Fang3
1 Institute of Optoelectronics Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074
2 Institute of Electronic Science and Engineering, National University of Defense Technology, Changsha 410073
3 Department of Physics, Shanghai University, Shanghai 200436
摘要We present a new optical sensor based on surface plasmon resonance (SPR) enhanced lateral optical beam displacements. Compared with the traditional SPR methods, the new method provides higher sensitivity to the sensor system. Theoretical simulations show that the refractive index (RI) detection sensitivity of the SPR sensor based on the displacement measurement has a strong dependence on the thickness of the metal film. When the optimal thickness of the metal film is selected, the RI resolution of the SPR sensor is predicted to be 2.2×10-7 refractive index units (RIU). Furthermore, it is found that the incidence angle can be used as a parameter to adjust the operating range of the sensor to different refractive index ranges.
Abstract：We present a new optical sensor based on surface plasmon resonance (SPR) enhanced lateral optical beam displacements. Compared with the traditional SPR methods, the new method provides higher sensitivity to the sensor system. Theoretical simulations show that the refractive index (RI) detection sensitivity of the SPR sensor based on the displacement measurement has a strong dependence on the thickness of the metal film. When the optimal thickness of the metal film is selected, the RI resolution of the SPR sensor is predicted to be 2.2×10-7 refractive index units (RIU). Furthermore, it is found that the incidence angle can be used as a parameter to adjust the operating range of the sensor to different refractive index ranges.
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2007, Vol. 24 
