摘要High temperature transport characteristics of unintentionally doped GaN have been investigated by means of high temperature Hall measurements from room temperature to 500°C. The increment of electron concentration from room temperature to 500°C is found to vary largely for different samples. The dispersion of temperature dependence of electron concentration is found to be directly proportional to the density of dislocations in GaN layers calculated by fitting the FWHM of the rocking curves in x-ray diffraction measurements (XRD). The buildup levels in persistent photoconductivity (PPC) are also shown to be directly proportional to the density of dislocations. The correlation of XRD, Hall and PPC results indicate that the high temperature dependence of electron density in unintentional doped GaN is directly dislocation related.
Abstract：High temperature transport characteristics of unintentionally doped GaN have been investigated by means of high temperature Hall measurements from room temperature to 500°C. The increment of electron concentration from room temperature to 500°C is found to vary largely for different samples. The dispersion of temperature dependence of electron concentration is found to be directly proportional to the density of dislocations in GaN layers calculated by fitting the FWHM of the rocking curves in x-ray diffraction measurements (XRD). The buildup levels in persistent photoconductivity (PPC) are also shown to be directly proportional to the density of dislocations. The correlation of XRD, Hall and PPC results indicate that the high temperature dependence of electron density in unintentional doped GaN is directly dislocation related.
WANG Mao-Jun;SHEN Bo;XU Fu-Jun;WANG Yan;XU Jian;HUANG Sen;YANG Zhi-Jian;QIN Zhi-Xin;ZHANG Guo-Yi. Effects of Dislocation on High Temperature Transport Characteristics of Unintentionally Doped GaN[J]. 中国物理快报, 2007, 24(6): 1682-1685.
WANG Mao-Jun, SHEN Bo, XU Fu-Jun, WANG Yan, XU Jian, HUANG Sen, YANG Zhi-Jian, QIN Zhi-Xin, ZHANG Guo-Yi. Effects of Dislocation on High Temperature Transport Characteristics of Unintentionally Doped GaN. Chin. Phys. Lett., 2007, 24(6): 1682-1685.
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