摘要By revealing the relationship between edge visibility and imaging parameters in in-line phase contrast imaging (PCI), we propose a method to quantitatively measure the contribution of absorption and phase shift from acquired images. We also prove that edge visibility will grow with the increasing source-object distance and object-detector distance. The result is validated by relative phase factor and by experiments conducted on a microfocus x-ray source. This method provides a new approach to evaluate in-line PCI images and is helpful for deciding imaging parameters.
Abstract：By revealing the relationship between edge visibility and imaging parameters in in-line phase contrast imaging (PCI), we propose a method to quantitatively measure the contribution of absorption and phase shift from acquired images. We also prove that edge visibility will grow with the increasing source-object distance and object-detector distance. The result is validated by relative phase factor and by experiments conducted on a microfocus x-ray source. This method provides a new approach to evaluate in-line PCI images and is helpful for deciding imaging parameters.
[1] Wilkins S W, Gureyev T E, Gao D, Pogany A and Stevenson A W 1996 Nature 384 335 [2] Cloetens P, Pateyron-Salome M, Buffiere J Y, Peix G, Baruchel J,Peyrin F and Schlenker M 1997 J. Appl. Phys. 81 5878 [3] Mayo S C, Davis T J, Gureyev T E, Miller P R, Paganin D, Pogany A,Stevenson A W and Wilkins S W 2003 Opt. Exp. 11 2289 [4] Spanne P, Raven C, Snigireva I and Snigirev A 1998 Phys. Med.Biol. 44 741 [5] Chapman D, Thomlinson W, Johnstonk R E, Washburn D, Pisano E, GmurN, Zhong Z, Menk R, Arfelli F and Sayers D 1997 Phys. Med. Biol. 42 2015 [6] Oltulu O, Zhong Z, Hasnah M, Wernick M N and Chapman D 2003 J. Phys. D: Appl. Phys. 36 2152 [7] Momose A, Takeda T and Itai Y 1995 Rev. Sci. Instrum. 66 1434 [8] Momose A 2003 Opt. Exp. 11 2303 [9] Pagot E, Fiedler S, Cloetens P, Bravin A, Coan P, Fezzaa K,Baruchel J and Hartwig J 2005 Phys. Med. Biol. 50 709 [10] Donnelly E F, Price R R and Pickens D R 2005 Med. Phys. 32 928 [11] Wu X and Liu H 2004 Med. Phys. 31 2378 [12] Wu X and Liu H 2003 J. X-Ray Sci. Tech. 11 33 [13] Pogany A, Gao D and Wilkins S W 1997 Rev. Sci. Instrum. 68 2774 [14] Wu X and Liu H 2005 Appl. Opt. 44 5847
2007, Vol. 24 
