摘要The interaction force between a solid probe and a planar air--water interface is measured by using an atomic force microscope. It is demonstrated that during the approach of the probe to the air--water interface, the force curves decline all the time due to the van der Waals attraction and induces a stable profile of water surface raised. When the tip approaches very close to the water surface, force curves jump suddenly, reflecting the complex behaviour of the unstable water surface. With a theoretical analysis we conclude that before the tip touches water surface, two water profiles appear, one stable and the other unstable. Then, with further approaching, the tip touches water surface and the non-contact to contact transition occurs.
Abstract：The interaction force between a solid probe and a planar air--water interface is measured by using an atomic force microscope. It is demonstrated that during the approach of the probe to the air--water interface, the force curves decline all the time due to the van der Waals attraction and induces a stable profile of water surface raised. When the tip approaches very close to the water surface, force curves jump suddenly, reflecting the complex behaviour of the unstable water surface. With a theoretical analysis we conclude that before the tip touches water surface, two water profiles appear, one stable and the other unstable. Then, with further approaching, the tip touches water surface and the non-contact to contact transition occurs.
WU Di;WANG Yi-Zhen;ZHANG Jin-Xiu. Non-Contact to Contact Transition: Direct Measurements of Interaction Forces between a Solid Probe and a Planar Air--Water Interface[J]. 中国物理快报, 2007, 24(10): 2914-2917.
WU Di, WANG Yi-Zhen, ZHANG Jin-Xiu. Non-Contact to Contact Transition: Direct Measurements of Interaction Forces between a Solid Probe and a Planar Air--Water Interface. Chin. Phys. Lett., 2007, 24(10): 2914-2917.
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