摘要Temporal evolution of absorption induced by single femtosecond pulse (130fs, 800nm) with high intensity in LiNbO3 is obtained using the probe shadow imaging technique in order to investigate light-induced electron relaxation processes. By saturating the polaron density with a high intensity laser pulse, ultra-fast decay process on picosecond time scale is observed. The decay time constant is about 141ps and it is attributed to the direct interband electron--hole recombination process.
Abstract：Temporal evolution of absorption induced by single femtosecond pulse (130fs, 800nm) with high intensity in LiNbO3 is obtained using the probe shadow imaging technique in order to investigate light-induced electron relaxation processes. By saturating the polaron density with a high intensity laser pulse, ultra-fast decay process on picosecond time scale is observed. The decay time constant is about 141ps and it is attributed to the direct interband electron--hole recombination process.
[1] Binh L N 2006 J. Crystal Growth 288 180 [2] Heanue J F, Bashaw M C and Hesselink L 1994 Science 265749 [3] Guo Y et al %, Liao Y, Cao L, Liu G, He Q and Jin G2004 Opt. Exp. 12 5556 [4] Berben D, Buse K, Wevering S, Herth P, Imlau M and Woike T 2000 J. Appl. Phys. 87 1034 [5] Herth P et al %, Schaniel D, Woike T, Granzow T, Imlau M and Kratzig E2005 Phys. Rev. B 71 125128 [6] Herth P et al %, Granzow T, Schaniel D, Woike T, Imlau M and Kratzig E2005 Phys. Rev. Lett. 95 067404 [7] Bai Y S and Kachru R 1997 Phys. Rev. Lett. 78 2944 [8] Pankratov V et al %, Millers D, Grigorjeva L, Matkovskii A O,%Potera P, Pracka I and Lukasiewicz T2003 Opt. Mater. 22 257 [9] Beyer O, Maxein D, Woike T and Buse K 2006 Appl. Phys. B 83 527 [10] Mao X L, Mao S S and Russo R E 2003 Appl. Phys. Lett. 82 697 [11] Sun Q et al %, Jiang H B, Liu Y, Wu Z X, Yang H and Gong Q H2005 Opt. Lett. 30 320 [12] Beyer O et al %, Maxein D, Buse K, Sturman B, Hsieh H T and Psaltis D2005 Phys. Rev. E 71 056603 [13] Sun Q et al %, Jiang H B, Liu Y, Zhou Y H, Yang H and Gong Q H2006 Chin. Phys. Lett. 23 189 [14] Mao S S et al%, Quere F, Guizard S, Mao X, Russo R E, Petite G and Martin P2004 Appl. Phys. A 79 1695 [15] Guizard S et al %, Martin P, Daguzan P, Petite G, Audebet P, Geindre J P,%Dossantos A and Antonnetti A1995 Europhys. Lett. 29 401
2007, Vol. 24 
