摘要Nanometre-scale particles can be manipulated using optical tweezers, but cannot be directly observed. We present a simple method that nanoparticles can be directly observed using optical tweezers combined with dark field microscopy. A laser beam perpendicular to a tightly focused laser beam for trap illuminates specimen and does not enter objective, nanoparticles in focal plane all can be directly observed in dark field because of light scattering. It is implemented that the polystyrene beads of diameter 100nm can be directly observed and trapped.
Abstract：Nanometre-scale particles can be manipulated using optical tweezers, but cannot be directly observed. We present a simple method that nanoparticles can be directly observed using optical tweezers combined with dark field microscopy. A laser beam perpendicular to a tightly focused laser beam for trap illuminates specimen and does not enter objective, nanoparticles in focal plane all can be directly observed in dark field because of light scattering. It is implemented that the polystyrene beads of diameter 100nm can be directly observed and trapped.
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2008, Vol. 25 
