An unusual form of ordered stress relief patterns is observed in a nearly free sustained aluminum film system deposited on liquid substrates by the thermal evaporation method. The edge effects on the growth of the ordered patterns are systematically studied. It is found that the patterns initiate from the film edges, preexisting ordered patterns, or other imperfections of the film. When the patterns extend in the film regions, they decay gradually and finally disappear. If they develop along the boundaries, however, the sizes are almost unchanged over several millimeters. The stress relief patterns look like rectangular waves in appearance, which are proven to evolve from sinusoidal to triangular waves gradually. The morphological evolution can be well explained by the general theory of buckling of plates.
An unusual form of ordered stress relief patterns is observed in a nearly free sustained aluminum film system deposited on liquid substrates by the thermal evaporation method. The edge effects on the growth of the ordered patterns are systematically studied. It is found that the patterns initiate from the film edges, preexisting ordered patterns, or other imperfections of the film. When the patterns extend in the film regions, they decay gradually and finally disappear. If they develop along the boundaries, however, the sizes are almost unchanged over several millimeters. The stress relief patterns look like rectangular waves in appearance, which are proven to evolve from sinusoidal to triangular waves gradually. The morphological evolution can be well explained by the general theory of buckling of plates.
[1] Coupeau C 2002 Thin Solid Films 406 190 [2] Wang Q, Wang C, Wang Z, Zhang J and He D 2008 Appl. Surf. Sci. 255 1836 [3] Moon M W, Jensen H M, Hutchinson J W, Oh K H and Evans A G 2002 J. Mech. Phys. Solids 50 2355 [4] Bowden N, Brittain S, Evans A G, Hutchinson J W and Whitesides G M 1998 Nature 393 146 [5] Chen X and Hutchinson J W 2004 Scripta Mater. 50 797 [6] Yoo P J and Lee H H 2003 Phys. Rev. Lett. 91 154502 [7] Ye G X, Michely Th, Weidenhof V, Friedrich I and Wuttig M 1998 Phys. Rev. Lett. 81 622 [8] Ye Q L, Yu S J, Jin J S and Ye G X 2003 Chin. Phys. Lett. 20 1109 [9] Yu S J, Zhang Y J, Ye Q L, Cai P G, Tang X W and Ye G X 2003 Phys. Rev. B 68 193403 [10] Yu S J, Zhang Y J, Cai P G, Ye Q L, Tang X W and Ye G X 2004 J. Phys.: Condens. Matter 16 L147 [11] Yang B 2005 Phys. Lett. A 341 516 [12] Chen M G, Xie J P and Ye G X 2006 Phys. Lett. A 360 323 [13] Fang Z N, Xie J P, Feng Y X, Zhang C H, Yang B and Ye G X 2008 Chin. Phys. Lett. 25 3338 [14] Xie J P, Xia A G, Zhang C H, Yang B, Fang Z N and Ye G X 2009 Chin. Phys. Lett. 26 117501 [15] Yu S J, Ye Q L, Zhang Y J, Cai P G, Xu X J, Chen J X and Ye G X 2005 Thin Solid Films 491 311 [16] Feng C M, Ge H L, Tang M R, Ye G X and Jiao Z K 1999 Thin Solid Films 342 30 [17] Tao X M, Ye G X, Ye Q L, Jin J S, Lao Y F and Jiao Z K 2002 Phys. Rev. B 66 115406 [18] Hutchinson J W, He M Y and Evans A G 2000 J. Mech. Phys. Solids 48 709 [19] Moon M W, Chung J W, Lee K R, Oh K H, Wang R and Evans A G 2002 Acta Mater. 50 1219 [20] Nir D 1984 Thin Solid Films 112 41
2010, Vol. 27 
