Determination of Photoelastic Constant Ratio of the Two Components in GexSi1-x/Si Superlattice
JIN Ying, ZHANG Shulin, ZHOU Guoliang*, YU Mingren*, QIN Guogang***
Departpent of Physics, and National Laboratory for Artificial Microstructure and Mesmcopic Physics, Peking University, Beijing 100871
*Surface Physics Laboratory, Fudan University, Shanghai 200433
**International Center for Materials Physics, Academia Sinica, Shenyang 110015,
and Department of Physics, Peking University, Beijing 100871
Determination of Photoelastic Constant Ratio of the Two Components in GexSi1-x/Si Superlattice
JIN Ying;ZHANG Shulin;ZHOU Guoliang*;YU Mingren*;QIN Guogang***
Departpent of Physics, and National Laboratory for Artificial Microstructure and Mesmcopic Physics, Peking University, Beijing 100871
*Surface Physics Laboratory, Fudan University, Shanghai 200433
**International Center for Materials Physics, Academia Sinica, Shenyang 110015,
and Department of Physics, Peking University, Beijing 100871
Abstract： From the intensity ratio of the folded longitudinal acoustic phonons with re-spect to the longitudinal acoustic phonon in a Ge0.51Si0.49/Si superlattice (SL),we obtained a photoelastic constant. ratio of 6.6 for Ge0.51Si0.49 alloy with re-spect to Si in the SL at wavelength 5145Å, which is 2.6 times greater than that obtainedby [He Phys.Rev. B39(1989) 5919] in a Ge0.51Si0.49/Si SL.
JIN Ying;ZHANG Shulin;ZHOU Guoliang*;YU Mingren*;QIN Guogang***. Determination of Photoelastic Constant Ratio of the Two Components in GexSi1-x/Si Superlattice[J]. 中国物理快报, 1992, 9(4): 213-216.
JIN Ying, ZHANG Shulin, ZHOU Guoliang*, YU Mingren*, QIN Guogang***. Determination of Photoelastic Constant Ratio of the Two Components in GexSi1-x/Si Superlattice. Chin. Phys. Lett., 1992, 9(4): 213-216.
1992, Vol. 9 
