Phase Determination Method to Directly Measure Intensity and Frequency of Temporal Profiles of Attosecond EUV Pulses
GE Yu-Cheng
Department of Technical Physics, Peking University, Beijing 100871
Phase Determination Method to Directly Measure Intensity and Frequency of Temporal Profiles of Attosecond EUV Pulses
GE Yu-Cheng
Department of Technical Physics, Peking University, Beijing 100871
关键词 ：
42.65.Re ,
42.65.Ky ,
32.80.Rm ,
42.30.Rx
Abstract ： A new method of phase determination is presented to directly measure the intensity and frequency temporal profiles of attosecond EUV pulses. The profiles can be reconstructed from the photoelectron energy spectra measured with two different laser intensities at 0°and 180° with respect to the linear laser polarization using a cross correlation between the femtosecond laser and the attosecond EUV. The method has a temporal measurement range from a quarter to about half of a laser oscillation period. The time resolution depends on the jitter and control precision of laser and EUV pulses. This method improves the time resolution in measuring attosecond EUV pulses.
Key words ：
42.65.Re
42.65.Ky
32.80.Rm
42.30.Rx
出版日期: 2005-08-01
:
42.65.Re
(Ultrafast processes; optical pulse generation and pulse compression)
42.65.Ky
(Frequency conversion; harmonic generation, including higher-order harmonic generation)
32.80.Rm
(Multiphoton ionization and excitation to highly excited states)
42.30.Rx
(Phase retrieval)
引用本文:
GE Yu-Cheng. Phase Determination Method to Directly Measure Intensity and Frequency of Temporal Profiles of Attosecond EUV Pulses[J]. 中国物理快报, 2005, 22(8): 1916-1919.
链接本文:
https://cpl.iphy.ac.cn/CN/
或
https://cpl.iphy.ac.cn/CN/Y2005/V22/I8/1916
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2005, Vol. 22 
