Experimental Investigation of Polycrystalline Material Deformation Based on a Grain Scale
LI Xi-De, YANG Yan, WEI Cheng
Department of Engineering Mechanics, FML, Tsinghua University, Beijing 100084
Experimental Investigation of Polycrystalline Material Deformation Based on a Grain Scale
LI Xi-De;YANG Yan;WEI Cheng
Department of Engineering Mechanics, FML, Tsinghua University, Beijing 100084
关键词 ：
42.30.Ms ,
81.40.Lm ,
81.70.Fy
Abstract ： We propose an experimental approach for investigation of the polycrystalline deformation behaviour at a grain scale. The technique is characterized by the joint application of micro material testing systems and the intragranular deformation analysis methods. It is attempting to map the deformation evolution at grain scale during the elastic and plastic deformations of polycrystalline specimens.
Key words ：
42.30.Ms
81.40.Lm
81.70.Fy
出版日期: 2005-10-01
:
42.30.Ms
(Speckle and moiré patterns)
81.40.Lm
(Deformation, plasticity, and creep)
81.70.Fy
(Nondestructive testing: optical methods)
引用本文:
LI Xi-De;YANG Yan;WEI Cheng. Experimental Investigation of Polycrystalline Material Deformation Based on a Grain Scale[J]. 中国物理快报, 2005, 22(10): 2553-2556.
链接本文:
https://cpl.iphy.ac.cn/CN/
或
https://cpl.iphy.ac.cn/CN/Y2005/V22/I10/2553
[1]
LEI Zhen-Kun;KANG Yi-Lan;CEN Hao;HU Ming. Variability on Raman Shift to Stress Coefficient of Porous Silicon
[2]
XIE Xin-Jian;ZHONG Fei;QIU Kai;LIU Gui-Feng;YIN Zhi-Jun;WANG Yu-Qi;LI Xin-Hua;JI Chang-Jian;HAN Qi-Feng;CHEN Jia-Rong;CAO Xian-Cun. Growth of Strain Free GaN Layers on (0001) Oriented Sapphire by Using Quasi-Porous GaN Template
[3]
MA Xiao-Su;HE Qing-Sheng;JIN Guo-Fan. Uniform Diffraction Efficiency for Three-Dimensional Dynamic-Static Speckle Multiplexing Holographic Storage
[4]
WEI Xun;XIAO Ti-Qiao;LIU Li-Xiang;DU Guo-Hao;CHEN Min;LUO Yu-Yu; XU Hong-Jie. Typical Microstructures of Chinese Medicines with X-Ray Microscopy in Phase Contrast
[5]
LEI Zhen-Kun;KANG Yi-Lan;CEN Hao;HU Ming;QIU Yu. Residual Stress on Surface and Cross-section of Porous Silicon Studied by Micro-Raman Spectroscopy
[6]
JIANG Hui-Feng;ZHANG Qing-Chuan;JIANG Zhen-Yu;CHEN Zhong-Jia;WU Xiao-Ping. Investigation of Kinematics of the Portevin--Le Chatelier Deformation Bands with Dynamic Digital Speckle Pattern Interferometry
[7]
JIANG Yu-Qiang;GUO Hong-Lian;LIU Chun-Xiang;LI Zhao-Lin;CHENG Bing-Ying;ZHANG Dao-Zhong;JIA Suo-Tang. Membrane Tether Formation on a Cell Surface with Reservoir
[8]
LEI Zhen-Kun; KANG Yi-Lan;QIU Yu; HU Ming; CEN Hao. Experimental Study of Capillary Effect in Porous Silicon Using Micro-Raman Spectroscopy and X-Ray Diffraction
[9]
CHENG Chuan-Fu;REN Xiao-Rong;LIU Chun-Xiang;ZHANG Ning-Yu;TENG Shu-Yun;XU Zhi-Zhan. Properties of Speckle Intensities in Near-Field Optical Regions by Numerical Solutions of Wave Equations
[10]
LEI Zhen-Kun;KANG Yi-Lan;HU Ming;QIU Yu;XU Han;NIU Hong-Pan. An Experimental Analysis of Residual Stress Measurements in Porous Silicon Using Micro-Raman Spectroscopy
[11]
GUO Hong-Lian;LIU Chun-Xiang;DUAN Jian-Fa;Jiang Yu-Qiang;HAN Xue-Hai;LI Zhao-Lin;CHENG Bing-Ying;ZHANG Dao-Zhong. Mechanical Properties of Breast Cancer Cell Membrane Studied with Optical Tweezers
[12]
AN Bing;ZHANG Tong-Jun;YUAN Chao;CUI Kun. Apparatus for Real-Time Measurement of Stress in Thin Films at
Elevated Temperatures
[13]
WANG Jin-Nan;HE Shu-Rong;HE Qing-Sheng;HUANG Dong;JIN Guo-Fan. Insensitivity of Speckle Multiplexing to Multi-longitudinal Modes of Laser in Volume Holographic Storage
[14]
GUO Hong-Lian;LIU Chun-Xiang;LI Zhao-Lin;DUAN Jian-Fa;HAN Xue-Hai;CHENG Bing-Ying;ZHANG Dao-Zhong. Displacement and Force Measurements with Quadrant Photodetector in Optical Tweezers
[15]
CHENG Chuan-Fu;LIU Man;TENG Shu-Yun;SONG Hong-Sheng;CHEN Jian-Ping;XU Zhi-Zhan. Experimental Characterization of Correlation-Functions of Random Surfaces by Speckle Measurement and Complementary Algorithm
2005, Vol. 22 
