中国物理快报  2005, Vol. 22 Issue (8): 2127-2129    
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Effect of Reverse Substrate Bias on Degradation of Ultra-Thin Gate-Oxide n-Channel Metal--Oxide--Semiconductor Field-Effect Transistors under Different Stress Modes
ZHAO Yao, XU Ming-Zhen, TAN Chang-Hua
Institute of Microelectronics, Peking University, Beijing 100871
Effect of Reverse Substrate Bias on Degradation of Ultra-Thin Gate-Oxide n-Channel Metal--Oxide--Semiconductor Field-Effect Transistors under Different Stress Modes
ZHAO Yao;XU Ming-Zhen;TAN Chang-Hua
Institute of Microelectronics, Peking University, Beijing 100871