中国物理快报  2006, Vol. 23 Issue (2): 489-492    
  Original Articles 本期目录 | 过刊浏览 | 高级检索 |
Dependence of Intrinsic Defects in ZnO Films on Oxygen Fraction Studied by Positron Annihilation
PENG Cheng-Xiao1, WENG Hui-Min1, YANG Xiao-Jie2, YE Bang-Jiao1, CHENG Bin1, ZHOU Xian-Yi1, HAN Rong-Dian1
1Department of Modern Physics, University of Science and Technology of China, Hefei 230026 2Key Laboratory of Nano-Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083
Dependence of Intrinsic Defects in ZnO Films on Oxygen Fraction Studied by Positron Annihilation
PENG Cheng-Xiao1;WENG Hui-Min1;YANG Xiao-Jie2;YE Bang-Jiao1;CHENG Bin1;ZHOU Xian-Yi1;HAN Rong-Dian1
1Department of Modern Physics, University of Science and Technology of China, Hefei 230026 2Key Laboratory of Nano-Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083