Surface Plasmon-Assisted Excitation of Atomic Visible Light Spectral Lines in the Impact of Highly Charged Ions 126 Xeq+ on Solid Surfaces
ZHANG Xiao-An1,2 , ZHAO Yong-Tao1,2 , LI Fu-Li1 , YANG Zhi-Hu2 , XIAO Guo-Qing2 , ZHAN Wen-Long2
1 Department of Applied Physics, Xi’an Jiao Tong University, Xi’an 710049
2 Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000
Surface Plasmon-Assisted Excitation of Atomic Visible Light Spectral Lines in the Impact of Highly Charged Ions 126 Xeq+ on Solid Surfaces
ZHANG Xiao-An1,2 ;ZHAO Yong-Tao1,2 ;LI Fu-Li1 ;YANG Zhi-Hu2 ;XIAO Guo-Qing2 ;ZHAN Wen-Long2
1 Department of Applied Physics, Xi’an Jiao Tong University, Xi’an 710049
2 Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000
关键词 ：
79.20.Rf ,
33.20.Kf ,
34.50.Dy
Abstract ： We measured the visible light spectral lines of sputtering atoms from solid surfaces of Al, Ti, Ni, Ta and Au which are impacted by 150 keV 126 Xeq+ (6 ≤ q ≤ 30). It is found that intensities of the light spectral lines are greatly and suddenly enhanced when the charge state of the ion is raised up to a critical value. If assuming that potential energy released from the incident ion due to capturing one electron is enough to excite a surface plasmon, we can estimate the critical charge states and obtain the results very well consistent with the measurements for the above mentioned target materials. This means that a surface plasmon induced by one electron capture can enhance the excitation of atomic visible light spectral lines in the impact of a highly charged ion on a solid surface.
Key words ：
79.20.Rf
33.20.Kf
34.50.Dy
出版日期: 2003-08-01
引用本文:
ZHANG Xiao-An;ZHAO Yong-Tao;LI Fu-Li;YANG Zhi-Hu;XIAO Guo-Qing;ZHAN Wen-Long. Surface Plasmon-Assisted Excitation of Atomic Visible Light Spectral Lines in the Impact of Highly Charged Ions 126 Xeq+ on Solid Surfaces[J]. 中国物理快报, 2003, 20(8): 1372-1375.
126 Xeq+ on Solid Surfaces. Chin. Phys. Lett., 2003, 20(8): 1372-1375.
链接本文:
https://cpl.iphy.ac.cn/CN/
或
https://cpl.iphy.ac.cn/CN/Y2003/V20/I8/1372
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