First Overtone Frequency Stimulated Quartz Tuning Fork Used for Shear-Force Scanning Near-Field Optical Microscopy
LIU Sheng1, SUN Jia-Lin1, SUN Hong-San2, TAN Xiao-Jing1, SHI Shuo1, GUO Ji-Hua1, ZHAO Jun1
1Key Laboratory of Atomic and Molecular Nanosciences of Education Ministry and Department of Physics, Tsinghua University, Beijing 100084
2CAAD Laboratory, Tsinghua University, Beijing 100084
First Overtone Frequency Stimulated Quartz Tuning Fork Used for Shear-Force Scanning Near-Field Optical Microscopy
LIU Sheng1;SUN Jia-Lin1;SUN Hong-San2;TAN Xiao-Jing1;SHI Shuo1;GUO Ji-Hua1;ZHAO Jun1
1Key Laboratory of Atomic and Molecular Nanosciences of Education Ministry and Department of Physics, Tsinghua University, Beijing 100084
2CAAD Laboratory, Tsinghua University, Beijing 100084
Abstract： The conventional 32.768 kHz tuning fork is stimulated at its first overtone resonant frequency of ～190 kHz for shear-force distance control. The time constant is measured to be 0.54 ms and it decreases about 40 times faster than that of the fundamental frequency (20.76 ms). The cross section of a corn root with height difference of ～3 μm is imaged at a scan speed of 12 μm/s for 256 x 256 pixels.
LIU Sheng;SUN Jia-Lin;SUN Hong-San;TAN Xiao-Jing;SHI Shuo;GUO Ji-Hua;ZHAO Jun. First Overtone Frequency Stimulated Quartz Tuning Fork Used for Shear-Force Scanning Near-Field Optical Microscopy[J]. 中国物理快报, 2003, 20(11): 1928-1931.
LIU Sheng, SUN Jia-Lin, SUN Hong-San, TAN Xiao-Jing, SHI Shuo, GUO Ji-Hua, ZHAO Jun. First Overtone Frequency Stimulated Quartz Tuning Fork Used for Shear-Force Scanning Near-Field Optical Microscopy. Chin. Phys. Lett., 2003, 20(11): 1928-1931.
2003, Vol. 20 
