Measurement of Root-Mean-Square Phase Errors in Arrayed Waveguide Gratings
ZHENG Xiao-Ping, CHU Yuan-Liang, ZHAO Wei, ZHANG Han-Yi, GUO Yi-Li
Department of Electronic Engineering, Tsinghua University, Beijing 100084
Measurement of Root-Mean-Square Phase Errors in Arrayed Waveguide Gratings
ZHENG Xiao-Ping;CHU Yuan-Liang;ZHAO Wei;ZHANG Han-Yi;GUO Yi-Li
Department of Electronic Engineering, Tsinghua University, Beijing 100084
关键词 ：
42.82.Et ,
42.87.-d ,
07.60.Ly
Abstract ： The interference-based method to measure the root-mean-square phase errors in SiO2 -based arrayed waveguide gratings (AWGs) is presented. The experimental results show that the rms phase error of the tested AWG is 0.72 rad.
Key words ：
42.82.Et
42.87.-d
07.60.Ly
出版日期: 2004-02-01
引用本文:
ZHENG Xiao-Ping;CHU Yuan-Liang;ZHAO Wei;ZHANG Han-Yi;GUO Yi-Li. Measurement of Root-Mean-Square Phase Errors in Arrayed Waveguide Gratings[J]. 中国物理快报, 2004, 21(2): 335-336.
链接本文:
https://cpl.iphy.ac.cn/CN/
或
https://cpl.iphy.ac.cn/CN/Y2004/V21/I2/335
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2004, Vol. 21 
