Modification of YBa2Cu3O27-δ Thin Film Using Atomic Force Microscope
YOU Li-Xing1, YIN Xiao-Bo2, FENG Yi-Jun1, YANG Sen-Zu1, KANG Lin1, WANG Mu1, WU Pei-Heng1
1Research Institute of Superconductor Electronics, Department of Electronic Science and Engineering, Nanjing University, Nanjing 210093
2State Key Laboratory of Solid State Microstructures, Department of Physics, Nanjing University, Nanjing 210093
Modification of YBa2Cu3O27-δ Thin Film Using Atomic Force Microscope
YOU Li-Xing1;YIN Xiao-Bo2;FENG Yi-Jun1;YANG Sen-Zu1;KANG Lin1;WANG Mu1;WU Pei-Heng1
1Research Institute of Superconductor Electronics, Department of Electronic Science and Engineering, Nanjing University, Nanjing 210093
2State Key Laboratory of Solid State Microstructures, Department of Physics, Nanjing University, Nanjing 210093
Abstract： A YBa2Cu3O27-δ thin film is modified by a probe electric field of an atomic force microscope to form a ridge with the width of only a grain cell. The modification varies with operation parameters of the bias voltage, the moving velocity of probe and the ambient humidity. Energy dispersive spectroscopy analysis shows only oxygen deficient in the modified YBCO thin film. As a result, the suppressed superconductivity was found in the junction crossed the ridge.
YOU Li-Xing;YIN Xiao-Bo;FENG Yi-Jun;YANG Sen-Zu;KANG Lin;WANG Mu;WU Pei-Heng. Modification of YBa2Cu3O27-δ Thin Film Using Atomic Force Microscope[J]. 中国物理快报, 2002, 19(6): 854-856.
YOU Li-Xing, YIN Xiao-Bo, FENG Yi-Jun, YANG Sen-Zu, KANG Lin, WANG Mu, WU Pei-Heng. Modification of YBa2Cu3O27-δ Thin Film Using Atomic Force Microscope. Chin. Phys. Lett., 2002, 19(6): 854-856.
2002, Vol. 19 
