Raman Study of Low-Temperature Phase Transitions in Polycrystalline Bi4Ti3O12 Thin Films
DU Yu-Lei1, CHEN Guang1, ZHANG Ming-Sheng2
1Department of Materials Science and Engineering, Nanjing University of Science and Technology, Nanjing 210094
2National Laboratory of Solid State Microstructures and Centre for Materials Analysis,Nanjing University, Nanjing 210093
Raman Study of Low-Temperature Phase Transitions in Polycrystalline Bi4Ti3O12 Thin Films
DU Yu-Lei1;CHEN Guang1;ZHANG Ming-Sheng2
1Department of Materials Science and Engineering, Nanjing University of Science and Technology, Nanjing 210094
2National Laboratory of Solid State Microstructures and Centre for Materials Analysis,Nanjing University, Nanjing 210093
Abstract： Polycrystalline Bi4Ti3O12 thin films were prepared on fused quartz substrates by pulsed laser deposition. The films were crystallized in the orthorhombic layer perovskite structure confirmed by x-ray diffraction and Raman spectroscopy. The two broad Raman bands centred at 57 and 93cm-1 at 300K break up into clusters of several sharp Raman peaks at 90K. The temperature dependence of Raman spectra indicates the occurrence of monoclinic distortion of orthorhombic structure at low temperature in the as-prepared Bi4Ti3O12 thin films.
2004, Vol. 21 
