Absolute Generalized Oscillator Strength Profile of Negative Ion Resonance at 8.9eV in C2 F6
FAN Xiao-Wei1,2 , GENG Zhen-Duo1 , ZHANG Yan-Song1 , K. T. Leung1
1 Department of Physics, Henan Normal University, Xinxiang 453007
2 Department of Chemistry, University of Waterloo, Waterloo, Ontario N2L 3G1, Canada
Absolute Generalized Oscillator Strength Profile of Negative Ion Resonance at 8.9eV in C2 F6
FAN Xiao-Wei1,2 ;GENG Zhen-Duo1 ;ZHANG Yan-Song1 ;K. T. Leung1
1 Department of Physics, Henan Normal University, Xinxiang 453007
2 Department of Chemistry, University of Waterloo, Waterloo, Ontario N2L 3G1, Canada
关键词 ：
34.80.Gs ,
34.50.Gb
Abstract ：A temporary negative ion resonance at 8.9eV in C2 F6 has been clearly identified using angle-resolved electron energy loss spectroscopy at 2.5keV impact energy, and can be attributed to electron capture into 12 alu , 12 a1g , 22 a2g , and 12 eg virtual molecular orbitals. The corresponding absolute generalized oscillator strength profile is found to have a shape characteristic of non-dipole interaction with the maximum K ～ 0.8a.u. of momentum transfer.
Key words ：
34.80.Gs
34.50.Gb
出版日期: 2005-03-01
:
34.80.Gs
(Molecular excitation and ionization)
34.50.Gb
(Electronic excitation and ionization of molecules)
引用本文:
FAN Xiao-Wei;GENG Zhen-Duo;ZHANG Yan-Song;K. T. Leung. Absolute Generalized Oscillator Strength Profile of Negative Ion Resonance at 8.9eV in C2 F6 [J]. 中国物理快报, 2005, 22(3): 591-594.
2 F6 . Chin. Phys. Lett., 2005, 22(3): 591-594.
链接本文:
https://cpl.iphy.ac.cn/CN/
或
https://cpl.iphy.ac.cn/CN/Y2005/V22/I3/591
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