Abstract： A probe-hole field emission microscope system, controlled by an Apple II computer, has been developed and operated successfully for measuring the work function of a single crystal plane. The work functions on the clean W(100) and W(111) planes are measured to be 4.67eV and 4.45eV, respectively.
GONG Yunming;ZENG Haishan. Probe-Hole Field Emission Microscope System Controlled by Computer[J]. 中国物理快报, 1991, 8(9): 446-449.
GONG Yunming, ZENG Haishan. Probe-Hole Field Emission Microscope System Controlled by Computer. Chin. Phys. Lett., 1991, 8(9): 446-449.
1991, Vol. 8 
