Spectroellipsometric Study of Lead Lanthanum Zirconate Titanate Amorphous Ferroelectric-Like Thin Films
LI Qiu-jun, ZHU De-rui, MO Dang, XU Yu-huan1, J. D. Mackenzie1
Department of Physics, Zhongshan University, Guangzhou 510275
1Department of Material Science and Engineering, University of California, Los Angeles, CA90024, U. S. A.
Spectroellipsometric Study of Lead Lanthanum Zirconate Titanate Amorphous Ferroelectric-Like Thin Films
LI Qiu-jun;ZHU De-rui;MO Dang;XU Yu-huan1;J. D. Mackenzie1
Department of Physics, Zhongshan University, Guangzhou 510275
1Department of Material Science and Engineering, University of California, Los Angeles, CA90024, U. S. A.
Abstract： Lead lanthanum zirconate titanate (PLZT) amorphous thin films whose composition is stoichiometric 9/65/35 have been grown and they show some wonderful ferroelectric-like properties. The ellipsometric spectra of the PLZT ferroelectric-like amorphous films have been obtained by a homemade automatic ellipsometer in the wave-length range of 200-700nm, and their optical constant (refractive index n and extinction coefficient k) spectra have been determined. As the photon energy changes from 1.9 to 5.8eV, the refractive index n of the PLZT amorphous films increases from 2.13 to 2.46, then decreases to 1.45. The absorption edge of the PLZT amorphous films is about 300nm, while that of the transparent ceramics with the same composition is about 377nm.
LI Qiu-jun;ZHU De-rui;MO Dang;XU Yu-huan;J. D. Mackenzie. Spectroellipsometric Study of Lead Lanthanum Zirconate Titanate Amorphous Ferroelectric-Like Thin Films[J]. 中国物理快报, 1998, 15(8): 600-602.
LI Qiu-jun, ZHU De-rui, MO Dang, XU Yu-huan, J. D. Mackenzie. Spectroellipsometric Study of Lead Lanthanum Zirconate Titanate Amorphous Ferroelectric-Like Thin Films. Chin. Phys. Lett., 1998, 15(8): 600-602.
1998, Vol. 15 
