Backward Secondary Electron Emission Yield of Thick Targets Induced by MeV Ions
JIANG Lei, ZHOU Zhu-Ying, ZHAO Guo-Qing
Applied Ion Beam Physics Laboratory, Institute of Modern Physics, Fudan University, Shanghai 200433
Backward Secondary Electron Emission Yield of Thick Targets Induced by MeV Ions
JIANG Lei;ZHOU Zhu-Ying;ZHAO Guo-Qing
Applied Ion Beam Physics Laboratory, Institute of Modern Physics, Fudan University, Shanghai 200433
关键词 :
79.20.Rf ,
34.50.Bw
Abstract : The backward secondary electron emission yields of MeV ions (H+ , He+ , He++ , Cl, Si, and Cu ) impinging on thick carbon and gold targets are studied. The measured results for H+ (1 MeV≤ E≤ 5MeV) on carbon are proportional to the electronic stopping power. Our experimental data and fitting formula of yields for H+ (1 MeV≤ E≤ 4.5 MeV) impacting Au are compared with the theoretical expectation. The influence of the collective field and the charge state of ions on the secondary electron emission yield is discussed.
Key words :
79.20.Rf
34.50.Bw
出版日期: 2000-09-01
:
79.20.Rf
(Atomic, molecular, and ion beam impact and interactions with surfaces)
34.50.Bw
(Energy loss and stopping power)
引用本文:
JIANG Lei;ZHOU Zhu-Ying;ZHAO Guo-Qing. Backward Secondary Electron Emission Yield of Thick Targets Induced by MeV Ions[J]. 中国物理快报, 2000, 17(9): 691-693.
JIANG Lei, ZHOU Zhu-Ying, ZHAO Guo-Qing. Backward Secondary Electron Emission Yield of Thick Targets Induced by MeV Ions. Chin. Phys. Lett., 2000, 17(9): 691-693.
链接本文:
https://cpl.iphy.ac.cn/CN/
或
https://cpl.iphy.ac.cn/CN/Y2000/V17/I9/691
[1]
WU Di;GONG Ye;LIU Jin-Yuan;WANG Xiao-Gang;LIU Yue;MA Teng-Cai. Propagation of Plasma Generated by Intense Pulsed Ion Beam Irradiation [J]. 中国物理快报, 2006, 23(8): 2255-2258.
[2]
LI Bin;MA Xin-Wen;ZHU Xiao-Long;LIU Hui-Ping;ZHANG Shao-Feng;QIAN Dong-Bin;CHEN Lan-Fang;FENG Wen-Tian;CAO Shi-Ping;SHA Shan;ZHANG Da-Cheng;. Average Energy Loss Measured in Single and Double Electron Capture Collisions of He2+ on Ar at Low Velocities [J]. 中国物理快报, 2006, 23(6): 1452-1455.
[3]
YIN Xiao-Ming;SONG Yuan-Hong;WANG You-Nian. Influence of Incident Velocity on the Penetration for C20 Clusters Moving through Oxides [J]. 中国物理快报, 2006, 23(10): 2741-2744.
[4]
GUAN Yong-Jing;RUAN Xiang-Dong;HE Ming;WANG Hui-Juan;LI Guo-Qiang;WU Shao-Yong;DONG Ke-Jun;LIN Min;JIANG Shan. Isobaric Identification Using Gas-Filled Time-of-Flight Measurements in an Accelerator Mass Spectrometry [J]. 中国物理快报, 2005, 22(7): 1622-1624.
[5]
QIN Xi-Feng; WANG Xue-Lin; LI Shi-Ling;HU Hui;CHEN Feng;WANG Ke-Ming;SHEN Ding-Yu;LIU Yao-Gang. Optical Waveguide in Gd0.275 Y0.725 Ca4 O(BO3 )3 Crystals Formed by MeV He Ion Implantation [J]. 中国物理快报, 2005, 22(4): 978-980.
[6]
XIA Hui-Hao;LIU Xiang-Dong. Range Distribution Parameters and Electronic Stopping Power for 19 F+ Ions in SnO2 , Indium-Tin Oxide, AgGaSe2 and AgGaS2 : Comparison Between Theory and Experiment [J]. 中国物理快报, 2004, 21(6): 1051-1054.
[7]
DING Fu-Rong;SHI Ping;HE Wei-Hong;WANG Yao; NIE Rui;SHEN Ding-Yu; MA Hong-Ji. Comparison of Secondary Ion Emissions from Carbon Nanotubes under Bombardments of MeV Si and Si2 Clusters [J]. 中国物理快报, 2004, 21(3): 562-564.
[8]
ZHANG Xiao-An;ZHAO Yong-Tao;LI Fu-Li;YANG Zhi-Hu;XIAO Guo-Qing;ZHAN Wen-Long. Surface Plasmon-Assisted Excitation of Atomic Visible Light Spectral Lines in the Impact of Highly Charged Ions 126 Xeq+ on Solid Surfaces [J]. 中国物理快报, 2003, 20(8): 1372-1375.
[9]
YU Wei;TENG Xiao-Yun;LI Xiao-Wei;FU Guang-Sheng. Process of Energetic Carbon Atom Deposition on Si (001) Substrate by Molecular Dynamics Simulation [J]. 中国物理快报, 2002, 19(4): 492-494.
[10]
LIU Feng;WANG Yu-Gang;XUE Jian-Ming;WANG Si-Xue;DU Guang-Hua;YAN Sha;ZHAO Wei-Jiang. Mechanism of Long-Range Penetration of Low-Energy Ions
in Botanic Samples [J]. 中国物理快报, 2002, 19(3): 378-380.
[11]
SHEN Yi-Xiong;JIANG Dong-Xing;LU Xi-Ting;SHEN Ding-Yu. Enhancement in Energy Loss of MeV Silicon Clusters in C Films [J]. 中国物理快报, 2001, 18(4): 525-527.
[12]
WANG Rui-Jin;XIA Yue-Yuan;MU Yu-Guang;ZHAO Ming-Wen;MA Yu-Chen;LIU Xiang-Dong;ZHANG Jian-Hua LIU Ji-Tian;YU Zeng-Liang. Deep Penetration of Charged Particles in Biological Samples [J]. 中国物理快报, 2001, 18(2): 208-210.
[13]
LIANG Jia-chang;;XU Zhou;LE Xiao-yun;ZHAO Wei-jiang;YU Fu-chun;LIU Zhi;CHEN Rong-ti;SUN Xian-ping;ZHENG Xi-zhi;DU Yo-ru;ZHAO Ming-xin;SHEN Lian-fang;GU Hong-en;LI Yi;SU Yi. Chemical Shifts of 23 Na in NaCl Crystal Specimens Implanted with Xenon Ions [J]. 中国物理快报, 1999, 16(8): 563-564.
[14]
JIANG Lei;LIU Bo;ZHOU Zhu-ying;HE Mian-hong;ZHAO Guo-qing;ZONG Xiang-fu. In Situ Rutherford Backscattering Spectrometry Analysis of Films by Combination with Sputter Etching [J]. 中国物理快报, 1999, 16(10): 770-772.
[15]
FANG De-qing;FENG Jun;CAI Xiang-zhou;WANG Jian-song;
SHEN Wen-qing;MA Yu-gang;ZHU Yong-tai LI Song-lin;
WU He-Yu;GOU Quan-bu;JIN Gen-ming;ZHAN Wen-long;
GUO Zhong-yan;XIAO Guo-qing. Detector Calibration by Monte Carlo Simulation Based on the Energy-Range Relationship of Energetic Ions
[J]. 中国物理快报, 1999, 16(1): 15-17.