Near-Field Optical Identification of Metallic and Semiconducting Single-Walled Carbon Nanotubes
Lele Wang1,2 , Bosai Lyu1,2 , Qiang Gao1,2 , Jiajun Chen1,2 , Zhe Ying1,2 , Aolin Deng1,2 , Zhiwen Shi1,2**
1 Key Laboratory of Artificial Structures and Quantum Control (Ministry of Education), Shenyang National Laboratory for Materials Science, School of Physics and Astronomy, Shanghai Jiao Tong University, Shanghai 2002402 Collaborative Innovation Center of Advanced Microstructures, Nanjing 210093
Abstract ：Single-walled carbon nanotubes (SWCNTs), due to their outstanding electrical and optical properties, are expected to have extensive applications, such as in transparent conductive films and ultra-small field-effect transistors (FETs). However, those applications can only be best realized with pure metallic or pure semiconducting SWCNTs. Hence, identifying and separating metallic from semiconducting SWCNTs in as-grown samples are crucial. In addition, knowledge of the type of an SWCNT is also important for further exploring its new properties in fundamental science. Here we report employing scanning near-field optical microscopy (SNOM) as a direct and simple method to identify metallic and semiconducting SWCNTs on SiO$_2$/Si substrates. Metallic and semiconducting SWCNTs show distinct near-field optical responses because the metallic tubes support plasmons whereas the semiconducting tubes do not. The reliability of this method is verified using FET testing and Rayleigh scattering spectroscopy. Our result demonstrates that the SNOM technique provides a reliable, simple, noninvasive and in situ method to distinguish between metallic and semiconducting SWCNTs.
收稿日期: 2019-10-24
出版日期: 2020-01-18
:
81.05.U-
(Carbon/carbon-based materials)
78.67.-n
(Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures)
68.37.Uv
(Near-field scanning microscopy and spectroscopy)
引用本文:
. [J]. 中国物理快报, 2020, 37(2): 28101-.
链接本文:
https://cpl.iphy.ac.cn/CN/10.1088/0256-307X/37/2/028101
或
https://cpl.iphy.ac.cn/CN/Y2020/V37/I2/28101
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2020, Vol. 37 
