中国物理快报  2020, Vol. 37 Issue (2): 27302-    DOI: 10.1088/0256-307X/37/2/027302
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Reduction of Electron Leakage of AlGaN-Based Deep Ultraviolet Laser Diodes Using an Inverse-Trapezoidal Electron Blocking Layer
Zhong-Qiu Xing1,2,3, Yong-Jie Zhou4, Yu-Huai Liu1,2,3**, Fang Wang1,2,3**
1National Joint Research Center for Electron Materials and Systems, Zhengzhou University, Zhengzhou 450001
2International Joint Laboratory of Electron Materials and Systems, Zhengzhou University, Zhengzhou 450001
3School of Information Engineering, Zhengzhou University, Zhengzhou 450001
4School of Physics and Electron Engineering, Xinyang Normal University, Xinyang 464000